2020
DOI: 10.1063/5.0012802
|View full text |Cite
|
Sign up to set email alerts
|

Mechanism of pressure induced amorphization of SnI4: A combined x-ray diffraction—x-ray absorption spectroscopy study

Abstract: We have studied the amorphization process of SnI 4 up to 26.8GPa with unprecedented experimental details by combining Sn and I K edge X-ray absorption spectroscopy and powder X-ray diffraction. Standards and reverse Monte Carlo extended X-ray absorption fine structure (EXAFS) refinements confirm that the SnI 4 tetrahedron is a fundamental structural unit that is preserved through the crystalline phase-I to crystalline phase-II transition about 7 to 10GPa and then in the amorphous phase that appears above 20GPa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
references
References 45 publications
0
0
0
Order By: Relevance