“…5, the threshold of structural state change occurs in the region of intensity near 10 4 W/cm 2 , that is, at the intensity 5 times lower than that used in Fig. 9), the estimated temperature will be 300 + 40·8 = 620 K ~ 350 °С, which is consistent with the data of previous studies on the tin induced crystallization of amorphous silicon [20,21].…”