Melt density, equilibrium melting temperature, and crystallization characteristics of highly pure cyclic poly(ε-Caprolactone)s

Accelerating the crystallization kinetics of linear polylactides by adding cyclic poly ( -lactide): Nucleation, plasticization and topological effects

“…From the crystallization point of view, the comparisons of cyclic and linear polymers in the literature show different and sometimes even opposite trends [1,[25][26][27][28][29][30][31][32][33][34][35][36][37][38][39][40][41][42][43][44], hence, their crystallization is still a debated topic [22]. As an alternative for such debate, simulations studies have been performed, but even for them, contradicting results have also been found in their predictions of the relative melting and equilibrium melting temperatures of cyclic and linear polymers [45][46][47].…”

“…However, most studies, both experimental and simulated, employing cyclic and linear polymers, have shown that cyclic polymers exhibit enhanced nucleation [28,29,43], faster spherulitic growth rates (G) [30][31][32][33]44] and faster overall crystallization [25,26,[34][35][36][37][38][39][40][41][42] (as determined by DSC, which includes both nucleation and growth) compared to their linear counterparts. Therefore, employing cyclic polymers as an additive to enhance the crystallization of linear PLA seems to be a good strategy.…”

Dual Nakamura model for primary and secondary crystallization applied to nonisothermal crystallization of poly(ether ether ketone)

“…The dual Avrami model parameters are presented in Table 1. Recently, Ryu et al [ 37 ] and Yi et al [ 38 ] have reported good fits of this dual Avrami model to cyclic poly(ε‐caprolactone) and polyaryletherketone (Victrex PEEK 151 and AM 200). In each polymer, reflects slower secondary crystallization kinetics.…”

n-Type Digital Memory Characteristics of Diketopyrrolopyrrole-Based Narrow Bandgap Polymers

“…Absorption spectra of spectroelectrochemistry experiments were measured on a UV–vis spectrophotometer (model 8453, Agilent Technologies, Santa Clara, CA, USA). For the polymer films prepared onto the Si substrates, specular X-ray reflectivity (XR) analysis was performed with a θ–2θ scanning mode at the 3D beamline − of the PLS-II facility (at an operation power of 3.0 GeV and 400 mA in a top-up mode), Pohang Accelerating Laboratory (PAL), Pohang, Korea. In the measurement, an X-ray beam of λ = 0.1240 nm (wavelength) was collimated at the film sample by a size of 2.0 mm (horizontal) and 0.1 mm (vertical); a four-circle goniometer (Huber, Rimsting, Germany) and a scintillation counter (EDR, Bede Scientific, Cheshire, England) were employed.…”