DOI: 10.31274/rtd-180813-1655
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Memory cell using bistable resistivity in amorphous As-Te-Ge film

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Cited by 5 publications
(2 citation statements)
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“…Ferroelectric Random Access Memory (FeRAM) [Hoya et al 2006] also promises better performance characteristics than flash, but lower storage density, capacity limitations, and higher cost issues remain to be addressed. On the other hand, Phase Change Memory (PCM [Sie 1969]) is a more imminent technology that has reached a level of maturity that permits deployment at commercial scale. Micron announced mass production of a 128Mbit PCM device in 2008, while Samsung announced the mass production of 512Mbit PCM device follow-on in 2009.…”
Section: Introductionmentioning
confidence: 99%
“…Ferroelectric Random Access Memory (FeRAM) [Hoya et al 2006] also promises better performance characteristics than flash, but lower storage density, capacity limitations, and higher cost issues remain to be addressed. On the other hand, Phase Change Memory (PCM [Sie 1969]) is a more imminent technology that has reached a level of maturity that permits deployment at commercial scale. Micron announced mass production of a 128Mbit PCM device in 2008, while Samsung announced the mass production of 512Mbit PCM device follow-on in 2009.…”
Section: Introductionmentioning
confidence: 99%
“…This glass system abounds with information about most of its physical properties (11,12,15,22,26,29,30,31).…”
Section: Methods Of Attackmentioning
confidence: 99%