MEMS inertial sensors measurement errors

Pachwicewicz, Marek; Weremczuk, Jerzy; Danielewski, Krzysztof

doi:10.1117/12.2501612

Search citation statements

Order By: Relevance

Paper Sections

Select...

Error Analysis1

B Bias Instability1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2019

Publication Types

Select...

Other1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(2 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Some of the main errors and sensitivities that affect interferometers are: (1) bias offset error, (2) bias instability, (3) temperature sensitivity, and (4) shock and vibration sensitivity [41,42]. Bias offset error is the systematic error that the instrument shows when it is at rest.…”

Section: Error Analysismentioning

confidence: 99%

See 1 more Smart Citation

Precision frequency measurement on a chip using weak value amplification

Steinmetz¹,

Lyons²,

Song³

et al. 2019

Quantum Communications and Quantum Imaging XVII

View full text Add to dashboard Cite

We present an integrated design to precisely measure optical frequency using weak value amplification with a multi-mode interferometer. The technique involves introducing a weak perturbation to the system and then post-selecting the data in such a way that the signal is amplified without amplifying the technical noise, as has previously been demonstrated in a free-space setup. We demonstrate the advantages of a Bragg grating with two band gaps for obtaining simultaneous, stable high transmission and high dispersion. We numerically model the interferometer in order to demonstrate the amplification effect. The device is shown to have advantages over both the free-space implementation and other methods of measuring optical frequency on a chip, such as an integrated Mach-Zehnder interferometer.

show abstract

Section: Error Analysismentioning

confidence: 99%

“…To quantify the advantage of this method, we compute the Allan variance of the MZI and the WVA interferometer [41,42,44]. The Allan variance is a measure of how quickly the rate of an accumulating signal is changing.…”

Section: B Bias Instabilitymentioning

confidence: 99%