2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2022
DOI: 10.1109/dft56152.2022.9962369
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MetaFS: Model-driven Fault Simulation Framework

Endri Kaja
1
,
Nicolas Gerlin
2
,
Monideep Bora
3
et al.
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Cited by 4 publications
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References 15 publications
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Gerlin,
Kaja,
Vargas
et al. 2023
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
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Bits, Flips and RISCs

Gerlin,
Kaja,
Vargas
et al. 2023
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
1
0
0
0
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Special Session: A Mixed Simulation-, Emulation-, and Formal-Based Fault Analysis Methodology for RISC-V

Kaja,
Gerlin,
Tahiraga
et al. 2024
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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An Automated and Effective Approach for SBST Generation Targeting RISC-V CPUs

Kaja,
Gerlin,
Halabi
et al. 2024
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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