2016
DOI: 10.1088/0957-4484/27/36/36lt01
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Metal assisted focused-ion beam nanopatterning

Abstract: Focused-ion beam milling is a versatile technique for maskless nanofabrication. However, the nonuniform ion beam profile and material redeposition tend to disfigure the surface morphology near the milling areas and degrade the fidelity of nanoscale pattern transfer, limiting the applicability of the technique. The ion-beam induced damage can deteriorate the performance of photonic devices and hinders the precision of template fabrication for nanoimprint lithography. To solve the issue, we present a metal assis… Show more

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Cited by 30 publications
(15 citation statements)
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“…An alternative approach to FIB milling is metalassisted FIB (MA-FIB) milling, which uses a metallic protective layer on top of the target layer [25]. The main purpose of using a protective layer in MA-FIB milling is to prevent blunt edges and protect the device surface against redeposition of milled material onto the surface.…”
Section: Discussionmentioning
confidence: 99%
“…An alternative approach to FIB milling is metalassisted FIB (MA-FIB) milling, which uses a metallic protective layer on top of the target layer [25]. The main purpose of using a protective layer in MA-FIB milling is to prevent blunt edges and protect the device surface against redeposition of milled material onto the surface.…”
Section: Discussionmentioning
confidence: 99%
“…Filling of a UV resin into nanostructures in the Si master mainly depends on the material properties of the UV resin used and the interfacial properties between the resin and the nanostructures [12, 13]. The material properties of the resin include the size (or molecular weight) of the monomer chain and the viscosity of the resin solution [4].…”
Section: Resultsmentioning
confidence: 99%
“…In this work, four UV resins with different properties were used to systematically study their filling into nanostructures in the fabrication of the UV-resin molds and their performance as thermal-NIL molds. Usually, nanostructures fabricated by direct focused ion beam (FIB) milling or metal-assist FIB milling have V-shaped and sharp cross-sections due to the re-deposition nature of FIB milling [12, 15]. Therefore, we used FIB milled sharp nanostructures as model nanostructures for this study.…”
Section: Introductionmentioning
confidence: 99%
“…Thanks to the fast progress in nanophotonic, the fabrication of the proposed structure is achievable with current technologies [ 73 , 74 , 75 , 76 , 77 , 78 , 79 , 80 , 81 , 82 , 83 , 84 , 85 , 86 , 87 , 88 ], allowing the cost-effective fabrication over a large area. A similar structure of a MIM waveguide with a central-coupled rectangular cavity has previously been fabricated using physical vapor deposition and a focused ion beam for etching the rectangular cavity [ 79 ].…”
Section: Structure Design and Simulation Methodsmentioning
confidence: 99%