“…The nature of the metal–semiconductor (MS) interface depends to a large extent not only on defects, such as dislocations, twins, sub grain boundaries and precipitates, but also on the atomistic and electronic surface properties in the form of reconstructions and relaxations, density of steps, surface states, and position of the Fermi level. Since the latter sensitively depends on the surface‐preparation procedures, the performance of such MSM devices is a strong function of surface preparation,10, 11 metallization methods,12, 13 heat treatments,2 and the contact metal itself. Furthermore, interfacial reactions (leading to an intermediate phase formation) between the metal and the CdZnTe surface may facilitate an intimate contact with superior properties, or degrade the contact region with a detrimental effect on the device performance.…”