2017
DOI: 10.1063/1.5000030
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Metal diffusion properties of ultra-thin high-k Sc2O3 films

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Cited by 8 publications
(1 citation statement)
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“…c) Bandgap diagrams and work function positions (dashed lines) of different TCOs, CBMs, TMOs, and FCMs with the c‐Si energy band edges (gray bar) as a reference. [ 112–133 ] d) Measured Schottky barrier heights of different TCOs, CBMs, and TMOs. [ 134–141 ] X‐ray photoelectron spectroscopy (XPS) spectra of e) nondoped, f) V‐doped, and g) Nb‐doped MoO 3− x films.…”
Section: Characterization Of Dfpc Materials With Key Parametersmentioning
confidence: 99%
“…c) Bandgap diagrams and work function positions (dashed lines) of different TCOs, CBMs, TMOs, and FCMs with the c‐Si energy band edges (gray bar) as a reference. [ 112–133 ] d) Measured Schottky barrier heights of different TCOs, CBMs, and TMOs. [ 134–141 ] X‐ray photoelectron spectroscopy (XPS) spectra of e) nondoped, f) V‐doped, and g) Nb‐doped MoO 3− x films.…”
Section: Characterization Of Dfpc Materials With Key Parametersmentioning
confidence: 99%