Crystallization - Science and Technology 2012
DOI: 10.5772/50064
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Metal Induced Crystallization

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Cited by 12 publications
(17 citation statements)
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“…This result agrees with the data from [14] where it was shown that in planar film structure "amorphous Si on crystalline Sn" Si crystallizes and Sn dissolves at the edge of these films in the course of annealing at 300…500 C. The production of polycrystalline silicon film on metallic substrates by forming a joint eutectic layer due exchange of neighboring atoms of the metal and Si a  films was analyzed in [15] and the "mechanism of exchange layer" was suggested for interpretation.…”
Section: Resultssupporting
confidence: 82%
“…This result agrees with the data from [14] where it was shown that in planar film structure "amorphous Si on crystalline Sn" Si crystallizes and Sn dissolves at the edge of these films in the course of annealing at 300…500 C. The production of polycrystalline silicon film on metallic substrates by forming a joint eutectic layer due exchange of neighboring atoms of the metal and Si a  films was analyzed in [15] and the "mechanism of exchange layer" was suggested for interpretation.…”
Section: Resultssupporting
confidence: 82%
“…These experimental results interpreted by the new MIC mechanism proposed in the papers [20][21][22]. It differs significantly from those known for other metals [13,[15][16][17]. According to this mechanism, silicon nanocrystals are formed due to cyclic repetition of formation and decomposition of a supersaturated silicon in tin solution on the narrow eutectic layer at a-Si/Sn interface of tin micro-droplets in amorphous Si volume.…”
Section: Introductionmentioning
confidence: 67%
“…One of promising ways in this direction is the use of metal-induced crystallization (MIC) of amorphous silicon [13][14][15][16][17]. In particular, the possibility to form Si nanocrystals in amorphous Si matrix at 2 to 5 nm sizes and the phase volume fraction up to 80% was shown by means of tin-stimulated crystallization of amorphous Si at low temperatures [18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…In particular, a possibility to form Si nanocrystals 2-7 nm in dimensions and with a phase volume fraction of up to 80% in the a-Si matrix with the help of the low-temperature tin-induced Si crystallization was demonstrated in [18][19][20]. Those experimental results were interpreted with the use of a new mechanism of MIC, which was proposed in works [20][21][22] and considerably differs from those known for other metals [13,[15][16][17]. According to this mechanism, silicon nanocrystals are formed as a result of the cyclic repetition of their formation and decay pro-cesses in the supersaturated solution of silicon in tin that emerges in a narrow eutectic layer at the a-Si/Sn interfaces between tin microdroplets and the bulk of amorphous Si.…”
Section: Introductionmentioning
confidence: 88%
“…One of the promising ways in this direction is the application of the phenomenon of metal-induced crystallization (MIC) of amorphous silicon (a-Si) [13][14][15][16][17]. In particular, a possibility to form Si nanocrystals 2-7 nm in dimensions and with a phase volume fraction of up to 80% in the a-Si matrix with the help of the low-temperature tin-induced Si crystallization was demonstrated in [18][19][20].…”
Section: Introductionmentioning
confidence: 99%