Metal-insulator multilayer precursors for enhanced Sm2+ absorption and Tm2+ luminescence in SiAlO thin films prepared by magnetron sputtering

Bosco, Giácomo Bizinoto Ferreira; Biesen, J.K. van den; Boers, C.D.; Simone, Giovanni de; Kao, Joe; Tichelaar, F.D.; Boshuizen, Bart; Kolk, Erik van der

doi:10.1016/j.jlumin.2021.118421

Cited by 4 publications

(4 citation statements)

References 21 publications

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“…The transmission spectra of all deposited films are displayed in figure 7. Interference fringes are evident in all films, and these were utilized to determine film thickness and refractive index using PARAV software [45]. The thickness of the deposited films ranged from 610 nm to 846 nm as the sprayed volume varied from 25 ml to 45 ml.…”

Section: Optical Resultsmentioning

confidence: 99%

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Aboud,

Al-Harbi,

Mostafa Khlifa

et al. 2024

Phys. Scr.

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Thin films of ZnO doped with 3wt% Lanthanum were deposited on glass substrates using spray pyrolysis for varying thicknesses. The impact of thickness on the physical properties of the films was investigated using various techniques. XRD results revealed the formation of a mixture of two phases, cubic Zinc Blende (ZB) and hexagonal Wurtzite (WU), with their ratios changing based on film thickness. Crystallite size measurements indicated that the cubic phase granules remained stable at 14.6 nm up to a thickness of 719 nm, decreasing to 14 nm at 846 nm, while the crystallite size of the hexagonal phase increased to 18 nm at 846 nm. FE-SEM images showed changes in surface morphology with increasing thickness, and EDX analysis demonstrated a consistent La/Zn ratio across all film thicknesses. The refractive index exhibited a shift from normal to abnormal dispersion when the thickness exceeded 719 nm, and the high-frequency dielectric constant decreased from 3.2 to 2.91 as thickness increased. Additionally, optical band gaps ranged from a minimum of 3.19 eV at 719 nm thickness to a maximum of 3.23 eV at 846 nm thickness. The study examined the effectiveness of the deposited films in blocking UV light with a wavelength of 365 nm. It was discovered that the decay time significantly decreased to 143s at a thickness of 661 nm, compared to longer times observed at other thicknesses.

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Section: Optical Resultsmentioning

confidence: 99%

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Aboud,

Al-Harbi,

Mostafa Khlifa

et al. 2024

Phys. Scr.

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“…The interference fringes shown in figure 10 were used to determine the thickness of all films using PARAV software [63]. The thickness of the films was measured to be 402 nm for pure ZnO, 240 nm for Zr-1 wt%, 303 nm for Zr-3 wt%, 259 nm for Zr-5 wt%, 244 nm for Zr-7 wt%, and 252 nm for Zr-10 wt%.…”

Section: Optical Propertiesmentioning

confidence: 99%

Properties of spray pyrolysis deposited Zr-doped ZnO thin films and their UV sensing properties

Alasmari,

Abd-Elraheem,

Aboud

et al. 2024

Phys. Scr.

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This study investigated the characteristics of Zr-doped ZnO thin films with varying Zr doping concentrations. X-ray diffraction (XRD) analysis confirmed the presence of the ZnO hexagonal phase without any additional phases detected. The crystallite size was determined using Scherrer’s equation and Halder-Wagner equation, revealing distinct trends as the Zr content increased. The impact of Zr doping concentration on structural properties such as lattice parameters was also explored. Field emission scanning electron microscopy (FESEM) images indicated agglomeration, with a peak value observed at Zr-5wt% of 175 nm that decreased at higher Zr contents. Optical properties exhibited minor variations with increasing Zr content, with the maximum band gap recorded at 3.28 eV for Zr-7wt% and Zr-10wt% films. Utilizing the Spitzer-Fan model, the high-frequency dielectric constant peaked at 14.26 for Zr-7wt% films. Optical mobility displayed fluctuations with rising Zr content. Direct current (DC) conductivity results unveiled two donor levels in the deposited films, showcasing minimum activation energies of 0.23 and 0.165 eV for high and low-temperature ranges in the Zr-3wt% film. Furthermore, the response to UV light illumination at a wavelength of 365 nm was examined, revealing notable changes in rise and decay times with varying Zr content. Overall, this comprehensive analysis sheds light on the intricate interplay between Zr doping concentrations and the physical properties of ZnO thin films, offering valuable insights for potential applications in various technological fields.

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“…3(a), the Sm 3d spectrum can be split into two lines because of spin-orbit interactions, and the rst main peak pair is related to the Sm 3+ component with the Sm 3d 3/2 and Sm 3d 5/2 located at 1109.9 (n 1 ) and 1083.0 eV (n 2 ), respectively. [32][33][34][35][36] However, a middle peak appeared at 1101 eV, which could be assigned to Sm 2+ . 32,33,36 Moreover, the Sm 3d 5/2 peak has a shoulder at the side of the lower binding energy of 1079.1 eV and this peak may be caused by the shake-off satellite effect.…”

Section: Sbcc and Its Chemical Statesmentioning

confidence: 99%

“…[32][33][34][35][36] However, a middle peak appeared at 1101 eV, which could be assigned to Sm 2+ . 32,33,36 Moreover, the Sm 3d 5/2 peak has a shoulder at the side of the lower binding energy of 1079.1 eV and this peak may be caused by the shake-off satellite effect. 37 In addition, as shown in Fig.…”

Section: Sbcc and Its Chemical Statesmentioning

confidence: 99%

Advancing cathodic electrocatalysis via an in situ generated dense active interlayer based on CuO₅ pyramid-structured Sm₂Ba_1.33Ce_0.67Cu₃O₉

Hou

Gong

2022

J. Mater. Chem. A

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Metal-insulator multilayer precursors for enhanced Sm2+ absorption and Tm2+ luminescence in SiAlO thin films prepared by magnetron sputtering

Cited by 4 publications

References 21 publications

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Properties of spray pyrolysis deposited Zr-doped ZnO thin films and their UV sensing properties

Advancing cathodic electrocatalysis via an in situ generated dense active interlayer based on CuO₅ pyramid-structured Sm₂Ba_1.33Ce_0.67Cu₃O₉

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Metal-insulator multilayer precursors for enhanced Sm2+ absorption and Tm2+ luminescence in SiAlO thin films prepared by magnetron sputtering

Cited by 4 publications

References 21 publications

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Effect of thickness on properties of La-doped Zinc Blende/Wurtzite ZnO thin films prepared by spray pyrolysis

Properties of spray pyrolysis deposited Zr-doped ZnO thin films and their UV sensing properties

Advancing cathodic electrocatalysis via an in situ generated dense active interlayer based on CuO5 pyramid-structured Sm2Ba1.33Ce0.67Cu3O9

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Advancing cathodic electrocatalysis via an in situ generated dense active interlayer based on CuO₅ pyramid-structured Sm₂Ba_1.33Ce_0.67Cu₃O₉