Metal Oxide Film for Growing Vertically Aligned Single-Walled Carbon Nanotubes

Abstract

A conventional TEM was extended to a time-resolving instrument by installing a pulsed microchannel plate as a lowcost time-resolving image detector and a pulsed electron beam shutter. The technique provides electron micrographs and diffraction pictures of non-recurring events on the nanosecond/micrometre scale within a commercial TEM.

Formation of iridium nanocrystals with highly thermal stability for the applications of nonvolatile memory device with excellent trapping ability

“…This is likely because the cluster effect may become dominant so that larger particles are easily formed as the film thickness increases. 15 In Fig. 1͑e͒, it is shown that the mean diameter of the size distribution is approximately 8 nm while the initial thickness is 4.5 nm.…”