We have studied surface passivation layers for the application on n-type p + nn + bifacial silicon solar cells. Thereby, we have examined their optimal composition and thickness with regards to passivation quality, optical properties, and especially the contact formation during a co-firing step. These parameters were addressed in separate investigations: 1) simulation of the optical properties of a bifacial silicon solar cell, 2) measurement of the passivation quality on lifetime samples, 3) measurement of contact resistance (of aerosol printed fingers) to analyze the contact formation during the co-firing process, and 4) differential scanning calorimetry measurement were conducted to fundamentally understand reactions during contact formation in a fast firing furnace. The passivation layers tested were silicon nitride (SiN x ), titanium oxide (TiO 2 ), and silicon oxide (SiO 2 ) on lowly phosphorus-doped silicon n + -layers, whereas aluminum oxide (Al 2 O 3 ) stacks, capped with SiN x and TiO 2 , were studied on lowly boron-doped silicon p + -layers. The results show that a dielectric stack, consisting of 10-nm-thick Al 2 O 3 and 60-nm-thick SiN x layers on the borondiffused silicon front side and a single 50-nm SiN x layer on the phosphorus-diffused silicon rear side, provides low emitter saturation current density (J 0e ) , high optical absorption current density, and low contact resistance for printed and co-fired contacts.