2019
DOI: 10.1051/epjap/2019180288
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Metallized ceramic substrate with mesa structure for voltage ramp-up of power modules

Abstract: As the available wide bandgap semiconductors continuingly increase their operating voltages, the electrical insulation used in their packaging is increasingly constrained. More precisely the ceramic substrate, used in demanding applications, represents a key multi-functional element is being in charge of the mechanical support of the metallic track that interconnects the semiconductor chips with the rest of the power system, as well as of electrical insulation and of thermal conduction. In this complex assembl… Show more

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Cited by 14 publications
(6 citation statements)
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“…In the geometric technique proposed in [83,84], a gap between the top Cu electrodes was created to form a mesa structure, leading to significant electric field reduction as shown in Figure 14. This mesa structure was fabricated as shown in Figure 15 by an ultrasonic machining technique.…”
Section: Mitigation Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…In the geometric technique proposed in [83,84], a gap between the top Cu electrodes was created to form a mesa structure, leading to significant electric field reduction as shown in Figure 14. This mesa structure was fabricated as shown in Figure 15 by an ultrasonic machining technique.…”
Section: Mitigation Methodsmentioning
confidence: 99%
“…The geometry of (a) conventional structure and (b) mesa structure and the corresponding electric field distribution[83], © [2019] EPJ AP.…”
mentioning
confidence: 99%
“…Nevertheless, such PE technological breakthrough will be accompanied by the need to miniaturize electrical systems, which will not only make it more complicated to manage the power density and extract the heat dissipated by the chips, but will also markedly intensify undue stresses within the power module. Effectively, increasing the voltage level in the current power module results in heightening the electric field at the junction between the ceramic substrate ( Figure 1 ), the metallic track borders and the encapsulating polymer [ 13 ]. The induced electrical constraint at this triple point can dramatically impair the performances of the power module and, subsequently, reduce its lifespan, when it exceeds the critical one allowed by the dielectric strength of the insulating materials, thereby limiting the voltage ratings for future systems.…”
Section: Introductionmentioning
confidence: 99%
“…In this regard, the electric field control at TP in order to limit PD is needed for future high voltage power modules. Methods to control the electric field E and protect the device by ameliorating the geometrical designs [4,5] or adding some new parts in critical area [6,7,8] have been proposed. The use of a bridging resistive surface layer, which connects the high voltage electrode and the ground potential [9,10], is regarded as an effective field control method.…”
Section: Introductionmentioning
confidence: 99%