Proceedings of the 36th International Spring Seminar on Electronics Technology 2013
DOI: 10.1109/isse.2013.6648212
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Method for in-situ thermal load testing of high-brightness LED arrays

Abstract: Frequently the direct assessment of the LEDs' junction temperature as one of the main parameters to evaluate the extent of the thermal load is possible only under laboratory conditions. In this paper we present the development of a cheap and reliable experimental method to establish the junction temperature of high-brightness LED arrays under operating conditions. It is based on the insitu determination of the temperature dependence of the LEDs' forward voltage drop. Three different types of high-flux LED arra… Show more

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