2016
DOI: 10.1108/ssmt-10-2015-0029
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Method for validating CT length measurement of cracks inside solder joints

Abstract: Purpose – This paper aims to develop a method to measure the length of cracks inside solder joints, which enables the validation of computed tomography (CT) crack length measurements. Design/methodology/approach – Cracks were formed inside solder joints intentionally by aging solder joints of 0603 size resistors with thermal shock (TS) test (−40 to +140°C, 2,000 cycles), and CT images were captured about them with different rotational in… Show more

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Cited by 6 publications
(3 citation statements)
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“…The location of the cracks depends on many factors (the materials used, the type of soldering technology, the package, the PCB material, geometric factors, etc.) [4,5]. Figure 8 shows an overview of crack failures occurring in a PCB assembly.…”
Section: Cracks: Pad Crateringmentioning
confidence: 99%
“…The location of the cracks depends on many factors (the materials used, the type of soldering technology, the package, the PCB material, geometric factors, etc.) [4,5]. Figure 8 shows an overview of crack failures occurring in a PCB assembly.…”
Section: Cracks: Pad Crateringmentioning
confidence: 99%
“…Currently, many related studies have been carried out in the fields of electronics and microelectronics. For example, X-ray μ-CT has been used to quantitatively characterize the number and volumes of pores [ 27 , 28 ], the crack length [ 29 , 30 ], and their distribution in solder joints [ 31 ]. This non-destructive method enables us to investigate the damage evolution of internal defects in solder joints under external loading, so as to elucidate the role of the microstructural characteristics in the damage process.…”
Section: Introductionmentioning
confidence: 99%
“…4). The length of cracks was also measured with our method, which is based on capturing high-resolution radiography X-ray images about the cracks in two perpendicular projection planes [60]. The radiography results were compared to the CT measurements.…”
Section: Micro-and Nano-scale Materials Characterizationmentioning
confidence: 99%