Method of Measurement of Mean Concentration for an Element Segregated in Layers by X-Ray Analysis

Abstract

Traditionally, in X-ray fluorescence analysis for the determination of elemental compositions, the fluorescence is measured from the irradiated side of the sample. The composition measurements obtained by this method are sensitive to a gradient in composition as a function of depth of the element being measured. This report presents a simple method for measuring a mean composition for an element segregated in layers applicable to thin samples so that the fluorescence can be measured on the side opposite to that being irradiated. It is shown that for a particular relation between the angle of incidence of the primary radiation and of the detection angle on the opposite side of the sample that a mean concentration can be measured for an element which is independent of the composition in the separate layers.