2018
DOI: 10.1364/ao.57.009722
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Method of thickness measurement for transparent specimens with chromatic confocal microscopy

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Cited by 42 publications
(18 citation statements)
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“…Once the damage area was determined, the microscope was then replaced by a chromatic confocal scanner for a detailed scanning (Yongqing Wang et al 2021). The physical principle of the chromatic confocal scanner is mainly from the wavelength dependence of a longitudinal chromatic aberration and the analysis of the spectral components from the reflection of light (Miks et al 2010;Yu et al 2018). The technical specializations of the device are listed in Table 1.…”
Section: Scanning Systemmentioning
confidence: 99%
“…Once the damage area was determined, the microscope was then replaced by a chromatic confocal scanner for a detailed scanning (Yongqing Wang et al 2021). The physical principle of the chromatic confocal scanner is mainly from the wavelength dependence of a longitudinal chromatic aberration and the analysis of the spectral components from the reflection of light (Miks et al 2010;Yu et al 2018). The technical specializations of the device are listed in Table 1.…”
Section: Scanning Systemmentioning
confidence: 99%
“…On the other hand, the recent system research works in confocal microscopy have been focused on the non-scanning type, so-called chromatic confocal microscopy (CCM), to use the chromatic aberration of optical components instead of adopting axial scanning mechanisms [ 57 , 58 , 59 ]. Corresponding to the chromatic focal positions, each wavelength of the reflected light is detected by a spectrometer, and the relationship between the focal positions and the wavelength shifts enables calculating the surface height of the specimen.…”
Section: Technology and Analysis In Optical Film Metrologymentioning
confidence: 99%
“…In the dual-confocal fiber-optic sensor [56], as shown in Figure 8A, a geometrical-ray model as illustrated in Figure 8B was used to obtain the analytical dependence between the thickness and the refractive index of a transparent plate with high accuracy, although the minimum measurable thickness was 1.7 μm. On the other hand, the recent system research works in confocal microscopy have been focused on the non-scanning type, so-called chromatic confocal microscopy (CCM), to use the chromatic aberration of optical components instead of adopting axial scanning mechanisms [57][58][59]. Corresponding to the chromatic focal positions, each wavelength of the reflected light is detected by a spectrometer, and the relationship between the focal positions and the wavelength shifts enables calculating the surface height of the specimen.…”
Section: Confocal Microscopymentioning
confidence: 99%
“…In 2017, Boettcher T et al [18] proposed a new hybrid single-shot imaging scheme that combined chromatic confocal and interference technology, to simultaneously measure the thickness and refractive index for translucent materials. In 2018, Zhang K et al [19] established a thickness measurement model by adding an auxiliary reflector below the specimen. This model was able to significantly enlarge the tolerance of the specimen placement.…”
Section: Of 16mentioning
confidence: 99%