Methodology and application of the nuclear resonance reaction 16O(α, α)16O for the profiling of titanium oxide

Patnaik, B.; Leite, C. V. Barros; Baptista, G.B.; Schweikert, E. A.; Cocke, D. L.; Quinones, L.; Magnussen, N.

doi:10.1016/0168-583x(88)90488-0

Cited by 34 publications

(3 citation statements)

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“…This background comes from elastic scattering by the silicon nuclei in the unoxidized part of the target. The relationship between the normalized resonant yields [8] of SiO 2 and the incident energy of a-particles is shown in Fig. 2.…”

Section: Resultsmentioning

confidence: 99%

“…The depth resolution mainly comes from the width of the resonance which is 10 keV. The depth resolution corresponding to the resonant width is 6 mg/cm 2 [8].…”

Section: Resultsmentioning

confidence: 99%

“…Up to now, this RES has been widely used for analyzing oxide thin films [8], in particular high T c superconducting materials [9]. To our knowledge, quantitative analysis of the oxygen concentration and relations between the composition and the optical properties of TiO x films deposited by e-beam evaporation has not been carried out.…”

Section: Introductionmentioning

confidence: 99%

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Influence of the Oxygen Partial Pressure on the Composition and Optical Properties of Electron-beam Evaporated TiOx Films

Jiang

Zhang

et al. 2002

phys. stat. sol. (a)

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Section: Resultsmentioning

confidence: 99%

“…The depth resolution mainly comes from the width of the resonance which is 10 keV. The depth resolution corresponding to the resonant width is 6 mg/cm 2 [8].…”

Section: Resultsmentioning

confidence: 99%

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Influence of the Oxygen Partial Pressure on the Composition and Optical Properties of Electron-beam Evaporated TiOx Films

Jiang

Zhang

et al. 2002

phys. stat. sol. (a)

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The application of ion beam analysis to calcium phosphate-based biomaterials

Russell

Alford

Luptak

et al. 1996

J. Biomed. Mater. Res.

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Ion beam technology may be applied in a straightforward fashion to the analysis and modification of biomaterials. For analytical purposes, characterization using megaelectron-volt He2+ ions provides a standardless, nondestructive means for accurately quantifying the composition of material surfaces and the thickness of thin films. In this study, three complementary ion backscattering techniques were utilized to characterize hydroxyapatite (HA) films: Rutherford backscattering spectrometry (RBS) can determine composition and amounts of elements heavier than He; forward recoil elastic spectrometry (FRES) can determine hydrogen content; resonance-enhanced RBS can quantify small amounts of light elements, e.g. carbon, by choosing a particular incident beam energy resulting in excitation of the light element nucleus. At this resonance energy, the scattering cross section greatly increases, improving elemental sensitivity. Sol-gel chemistry was used to synthesize HA films by spin coating and annealing in a rapid thermal processor. Using these techniques, the chemical composition of unfired films was Ca1.63O5.4H1.8C0.24P with a thickness of 3.01 x 10(18) atoms/cm2 and after firing at 800 degrees C as Ca1.66O4.0H0.26C0.09P with a thickness of 2.11 x 10(18) atoms/cm2. This compares favorably to stoichiometric HA, which has a composition of Ca1.67O4.33H0.33P.

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