Methodology of an Accurate Static I–V Characterization of Power Semiconductor Devices

Recovery of Photovoltaic Potential-Induced Degradation Utilizing Automatic Indirect Voltage Source

“…In addition, we have taken all the EL images under short circuit current conditions to capture the best image quality. And to obtain the power measurements, a maximum power point tracking unit (FLEXmax 80) was used; this device has a 98% tracking efficiency, and the current-voltage (I-V) [19,20] curve can also be extracted from the collected measurements.…”