2020
DOI: 10.1109/access.2020.3007216
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Methods of Controlling Lift-Off in Conductivity Invariance Phenomenon for Eddy Current Testing

Abstract: Prev iously, a conductivity invariance phenomena (CIP) has been discovered-at a certa in lift-off, the inductance change of the sensor due to a test sample is immune to conductivity variations, i.e. the inductance-lift-off curve passes through a common point at a certain lift-off, termed as conductivity invariance lift-off. However, this conductivity invariance lift-off is fixed for a particular sensor setup, which is not convenient for various sample conditions. In this paper, we propose using two parameters … Show more

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Cited by 16 publications
(2 citation statements)
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“…However, a preknowledge is required to select the efficient parameters that can effectively represent CUI [78]. Moreover, the ECT is sensitive to lift-off variations between the probe and the inspected surface, which degrades the depth penetration [79,80].…”
Section: Eddy Current Testingmentioning
confidence: 99%
“…However, a preknowledge is required to select the efficient parameters that can effectively represent CUI [78]. Moreover, the ECT is sensitive to lift-off variations between the probe and the inspected surface, which degrades the depth penetration [79,80].…”
Section: Eddy Current Testingmentioning
confidence: 99%
“…Besides, reducing number of turns of the sensor array is also in need for small-scale applications, for example in detecting defects on small bearing balls with small radius of 4 mm or less. Although promoting image stability, large number of turns will introduce thicker detection coil and introduce to relative lift-off which results in uncertainties in measurement [14,15]. The implementation of small number of turns has some barriers, such as low received signal value due to low coupling.…”
Section: Introductionmentioning
confidence: 99%