Methods of protection of FPGA-based digital devices from ionizing radiation in space conditions

Abstract

Semiconductor devices, such as programmable logic integrated circuits (PLICs), are exposed to ionizing radiation in space conditions, which leads to negative consequences, changes in electrical characteristics, appearance of parasitic currents and occurrence of single faults (SEU). In this paper, design-technological and hardware-software methods for improving the radiation resistance of FPGA-based digital devices are discussed. The design-technological methods focus on the use of shields made of materials with high absorption properties, the use of radiation-resistant manufacturing processes such as silicon-on-insulator (SIN), optimization of transistor design and selection of radiation-resistant materials. Mathematical models describe the reduction of induced charge and the change in the threshold voltage of transistors under the influence of radiation. Hardware and software methods are based on the introduction of redundancy and the use of algorithms to detect and correct errors caused by radiation effects. Modular and temporal redundancy, noise-tolerant coding, and reconfiguration techniques are discussed. Modular redundancy uses triple redundant components with majority voting to determine the correct output. Temporal redundancy combines hardware and temporal redundancy to detect time-shifted errors. Mathematical reliability analysis of redundancy systems is carried out using exponential models of failure probability. Recommendations on the optimal choice of protection methods depending on specific operating conditions, reliability requirements and resource constraints are proposed