2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) 2018
DOI: 10.1109/i2mtc.2018.8409653
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Metrological characterization of high-performance delta-sigma ADCs: A case study of CERN DS-22

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Cited by 5 publications
(6 citation statements)
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“…According to the research results presented in [12,[21][22][23], this correlation can be neglected. Therefore, it is proposed to describe the signal e x,q (i) associated with the i-th realization of the quantization error using an uncorrelated additive noise model with the same probability of obtaining each of the possible realization values in the interval:…”
Section: Properties Of the Analog-to-digital Convertermentioning
confidence: 99%
“…According to the research results presented in [12,[21][22][23], this correlation can be neglected. Therefore, it is proposed to describe the signal e x,q (i) associated with the i-th realization of the quantization error using an uncorrelated additive noise model with the same probability of obtaining each of the possible realization values in the interval:…”
Section: Properties Of the Analog-to-digital Convertermentioning
confidence: 99%
“…However, beams are present already before this state is reached, so the measurement chain must ensure smooth operation from beam injection through ramp-up to the flat top. Transients, sharp steps, or signal artifacts such as idle tones [2], [3] are undesirable, as they could lead to increased beam losses, or in the worst scenario to tripping of the PC and subsequent beam dump.…”
Section: G Slow Linear Ramp Responsementioning
confidence: 99%
“…Previous estimates of the broadband and low-frequency noise of the digitizer were improved near its full scale and throughout the measurement range using noise-free test voltages generated by the PJVS. The uncertainty in the measurement of nonlinearity was also reduced with respect to classical methods counting on the linearity of DVMs [3], [24], [29], Fig. 13.…”
Section: H Long-term Stabilitymentioning
confidence: 99%
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“…It can be noticed that the realization values of the discussed error signal depend on the realization values of the ADC input quantities. According to the research results presented in [12,[21][22][23], this correlation can be neglected. Therefore, we propose describing the signal e x,q (i) associated with the i-th realization of the quantization error using an uncorrelated additive noise model with the same probability of obtaining each of the possible realization values in the interval:…”
Section: Properties Of the Analog-to-digital Convertermentioning
confidence: 99%