Metrological Studies in the Field of Phase-angle Measurement

Tarbeyev, Yu.V.; Kravchenko, S. A.; Koltik, E. D.

doi:10.1088/0026-1394/24/3/001

Metrologia

1987

DOI: 10.1088/0026-1394/24/3/001

|View full text |Cite

Metrological Studies in the Field of Phase-angle Measurement

Yu.V. Tarbeyev

S. A. Kravchenko

E. D. Koltik

Abstract: The paper presents a discussion of the studies carried out at VNIIM on the measurement assurance of working and reference instruments in the field of measuring phase-shift angle (PSA) between two electric potentials. A description is given of the block diagram of the PSA standard and standard measures (phase calibrators) as well as the wide-band phase comparator designed to transfer the size of the PSA from the standard to lower echelons of the hierarchical chain. It is shown that the instrumental uncertainty … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1992

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

The effect of deep frequency division and its possible applications in precision phase measurements

Kravchenko¹

1992

Meas Tech

View full text Add to dashboard Cite

Phase angle measurements are used in all leading fields of science and engineering --in space research, in ranging and navigation measurements, and automatic control, etc. Their accuracy is constantly increasing. Especially accurate phase meters must be certified against standards [i].Standards for reproduction of phase angles between two electrical voltages, e.g., in the NBS of the USA and FRG, have an error not exceeding 0.003 to 0.01 ~ only at relatively low frequencies from 10 -3 Hz to 20-50 kHz [2,3]. Besides certification of phase measuring instruments, modern science and engineering (circular particles accelerators, optoelectronic systems in microcircuit technology, etc.) demand setting of phase angles at high frequencies up to 30 MHz and more with a resolution of 10 -3 to 10 -4 deg [4]. This presents the following difficulties. Accuracy is usually increased by dividing the frequency of the standard source in two channels by a factor of, e.g., i0 to i00. Simultaneously, the phase angle, the phase angle error, and the frequency also are divided, i.e., the desired goal is not attained, since the higher the accuracy the lower the frequency and vice versa. For example, in the FI-4 instrument at frequencies below i MHz (36 MHz divided by 36), the phase step is i0 ~ with an error of 0.03 ~ and at i0 MHz (120 MHz divided by 12) 30 ~ and 0.15 ~ respectively. For a resolution of at least 0.1 ~ at 10 MHz a frequency of 36000 MHz must be divided by 3600, which is at present unrealistic to achieve directly, i.e., without heterodyning.This "vicious circle"has been broken using the effect of deep frequency division (DFD) in the decade structure of direct frequency synthesis based on the 8 + i + 1 algorithm [5,6]. where K > 1 is a coefficient that gives the desired output frequency, 0 < m < 9 is the coefficient of variation of the output frequency within one decade, and F 8 = Fs'8 and FI = F s" i.To simplify setting of phase angles and frequencies, all decades are fixed at m = 0, i.e., ~(8+L+~)K/L0=~K.Thus, the output frequencies of decades DCI through DC m are FsK , while the output frequency of decade DCm+I, 10FsK, are applied to the output circuit unit OCUI of channel I of the DFDS.The phase angle is set in mixer M2 of converter DCI by replacing the frequency F I = Fs(K + m0/10) with the frequency F I' = Fs(K + mz/10) at the instants when the frequencies corresponding to m = 0 and m z = 1 coincide: this state remains for a time t and is then replaced by the state m0 = 0 (Fig. 2). The phase angle is then given by

show abstract

The effect of deep frequency division and its possible applications in precision phase measurements

Kravchenko¹

1992

Meas Tech

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Metrological Studies in the Field of Phase-angle Measurement

Cited by 1 publication

References 1 publication

The effect of deep frequency division and its possible applications in precision phase measurements

The effect of deep frequency division and its possible applications in precision phase measurements

Contact Info

Product

Resources

About