Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

Naftaly, Mira; Clarke, Roland; Humphreys, D.A.; Ridler, N M

doi:10.1109/jproc.2016.2644108

Cited by 37 publications

(24 citation statements)

References 73 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Typically, either parabolic mirrors [2] or lenses [1] are employed (between these antennas) to prevent divergence of the beam. Time-domain spectroscopy (TDS) [15], [16] is another popular technique based on free-space measurement. TDS has several appealing advantages, including relatively low cost and the applicability of the measurement technique over a wide frequency range [17].…”

Section: Characterization Of Dielectric Materialsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

Self Cite

View full text Add to dashboard Cite

This article presents an in-depth study of a new vector network analyzer (VNA)-based electromagnetic material measurement method relying on a commercially available material characterization kit (MCK). These MCKs provide effectively a guided free-space technique with less stringent requirement on alignment compared with conventional free-space techniques. Coupled with time gating, these MCKs employ a simple calibration, composed of reflect and thru standards only, prior to taking reflection and transmission S-parameter measurements. This MCK-based method complements other conventional measurement techniques, e.g., time-domain spectroscopy (TDS) and resonant cavity, allowing fast broadband dielectric material characterization over the millimeter-and submillimeter-wave frequency ranges. In this article, a WR-15 (50-75 GHz) MCK is utilized for the measurements of S-parameters for seven types of low-loss dielectric material. Their dielectric constant and loss tangent are extracted from S-parameters and are compared against literature values. A relatively good agreement is achieved. Moreover, an investigation into the uncertainties of the extracted dielectric constant and loss tangent is performed and reported.

show abstract

Section: Characterization Of Dielectric Materialsmentioning

confidence: 99%

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Wang

Shang

Ridler

et al. 2020

IEEE Trans. Instrum. Meas.

Self Cite

View full text Add to dashboard Cite

show abstract

“…The measurement of the dielectric properties of materials in the THz band is most commonly performed using a vector network analyzer (VNA) or a time-domain spectrometer (TDS) [7]. A VNA allows terahertz measurement in the frequency domain and the frequency coverage has been extended to 1.5 THz in recent years using waveguide-based frequency extension modules.…”

Section: Introductionmentioning

confidence: 99%

The dielectric properties of some ceramic substrate materials at terahertz frequencies

Wang

Navarro‐Cía

et al. 2019

Journal of the European Ceramic Society

View full text Add to dashboard Cite

Where a licence is displayed above, please note the terms and conditions of the licence govern your use of this document. When citing, please reference the published version. Take down policy While the University of Birmingham exercises care and attention in making items available there are rare occasions when an item has been uploaded in error or has been deemed to be commercially or otherwise sensitive.

show abstract

“…1. This is a good approximation at THz frequencies [21] as shown later in Section IV. The impinging wave is a Gaussian beam whose electric field on the plane z = 0 is assumed to be of the form…”

Section: Methods Of Moments Analysismentioning

confidence: 52%

Far-Field and Near-Field Physics of Extraordinary THz Transmitting Hole-Array Antennas

Camacho

Boix

Kuznetsov

et al. 2019

IEEE Trans. Antennas Propagat.

View full text Add to dashboard Cite

Despite three decades of effort, predicting accurately extraordinary transmission through subwavelength hole arrays has proven challenging. The lack of quantitative design and modeling capability to take into account the inherent complexity of high frequency instrumentation has prevented the development of practical high-performance components based on this phenomenon. This paper resorts to the Method of Moments to provide not only such missing quantitative prediction but also a theoretical framework to understand and shed more light on the far-field and near-field physics of the extraordinary terahertz (THz) transmission through subwavelength hole arrays under different illumination and detection conditions. An excellent agreement between the numerical and experimental results with various illumination and detection setups is obtained, demonstrating the suitability of this computationally efficient modeling tool to predict the response of extraordinary transmission structures in practical situations.Index Terms-Extraodinary transmission, frequency selective surface, Method of Moments, quasi-optics, terahertz (THz), time-domain spectrometer.

show abstract

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

Cited by 37 publications

References 73 publications

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique

The dielectric properties of some ceramic substrate materials at terahertz frequencies

Far-Field and Near-Field Physics of Extraordinary THz Transmitting Hole-Array Antennas

Contact Info

Product

Resources

About