Galfenol Fe 83 Ga 17 films are sputtered on Si wafers without, and with Ti or Ti/Cu metallic seed layers in order to obtain a magnetoelastic layer which is sensitive to bending deformations of the compound structure. The layer thicknesses range from 100 nm to 5 μm. Layer morphology, texture, and the Villari effect are examined. The texture of the Galfenol films is strongly influenced by the seed layer. No low-index texture components are found for films directly deposited on Si and SiO 2 . On Ti, a (111) texture is formed on layers with more than 1000 nm thickness. A favorable (110) fiber texture is formed on Ti/Cu. Deforming the bimorphs (Si + layer system) by 0.012%, the Villari effect is detected due to the change in relative permeability. The maximum change occurs for Galfenol films with a thickness of 1 μm on a Ti/Cu buffer layer. The films open a route to the incorporation of magnetoelastic films into integrated magnetoelastic sensor devices.