Micro Deformation Measurement Using Temporal Phase-Shifting and Spatial-Carrier Digital Speckle Pattern Interferometry

Wu, Sijin; Gao, Xinya; Lv, Yong; Jiang, Yanpeng; Fang, Yao Min; Zhou, Aiguo

doi:10.4271/2016-01-0415

Cited by 2 publications

(2 citation statements)

References 15 publications

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“…The intensity distribution of the interferograms captured can be expressed by O * are the corresponding conjugate complexes. Fourier transform and inverse Fourier transform are employed to extract the phase [16] . Applying Fourier transform to Eq.…”

Section: Methodsmentioning

confidence: 99%

Synchronous Measurement of Three-Dimensional Deformations Using Tri-Channel Spatial-Carrier Digital Speckle Pattern Interferometry

Fang

Yang

2017

AMM

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Spatial-carrier digital speckle pattern interferometry (SC-DSPI) has proven to be a competitive tool for full-field deformation measurement. Comparing with traditional phase-shifting digital speckle pattern interferometry, SC-DSPI has the advantage of rapid measurement which guarantees that dynamic deformations can be precisely measured. In this article, a tri-channel SC-DSPI that measures three-dimensional deformations synchronously is introduced. Measuring algorithm as well as optical arrangement is described in detail. Experiments are carried out to verify the validity and evaluate the performance of the proposed technique.

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Section: Methodsmentioning

confidence: 99%

Synchronous Measurement of Three-Dimensional Deformations Using Tri-Channel Spatial-Carrier Digital Speckle Pattern Interferometry

Fang

Yang

2017

AMM

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“…The dynamic measurement speed depends on the camera frame rate. Though SC-DSPI outperforms PS-DSPI in terms of synchronous and dynamic measurement, its disadvantages include a lower-quality phase map [17], greater loss of laser energy, and much smaller measuring area, thus limiting its use in practical applications.…”

Section: Introductionmentioning

confidence: 99%

Universal optical setup for phase-shifting and spatial-carrier digital speckle pattern interferometry

Dong

Fang

et al. 2016

J. Eur. Opt. Soc.-Rapid Publ.

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Background: Digital speckle pattern interferometry (DSPI) is a competitive optical tool for full-field deformation measurement. The two main types of DSPI, phase-shifting DSPI (PS-DSPI) and spatial-carrier DSPI (SC-DSPI), are distinguished by their unique optical setups and methods of phase determination. Each DSPI type has its limited ability in practical applications. Results: We designed a universal optical setup that is suitable for both PS-DSPI and SC-DSPI, with the aim of integrating their respective advantages, including PS-DSPI's precise measurement and SC-DSPI's synchronous measurement, improving DSPI's measuring capacity in engineering. Conclusion: The proposed setup also has several other advantages, including a simple and robust structure, easy adjustment and operation, and versatility of measuring approach.

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Micro Deformation Measurement Using Temporal Phase-Shifting and Spatial-Carrier Digital Speckle Pattern Interferometry

Cited by 2 publications

References 15 publications

Synchronous Measurement of Three-Dimensional Deformations Using Tri-Channel Spatial-Carrier Digital Speckle Pattern Interferometry

Synchronous Measurement of Three-Dimensional Deformations Using Tri-Channel Spatial-Carrier Digital Speckle Pattern Interferometry

Universal optical setup for phase-shifting and spatial-carrier digital speckle pattern interferometry

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