Handbook of Technical Diagnostics 2013
DOI: 10.1007/978-3-642-25850-3_14
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Micro-Diagnostics: X-ray and Synchrotron Techniques

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Cited by 9 publications
(4 citation statements)
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“…X-ray refraction techniques were introduced a couple of decades ago [18] and have been successfully used for both material characterization and non-destructive testing [19]. X-ray refraction techniques are used to obtain the amount of the relative internal specific surface (i.e., surface per unit volume, relative to a reference state) of a specimen, and are therefore beneficial in the investigation of defects such as cracks and pores within ceramic components.…”
Section: Methodsmentioning
confidence: 99%
“…X-ray refraction techniques were introduced a couple of decades ago [18] and have been successfully used for both material characterization and non-destructive testing [19]. X-ray refraction techniques are used to obtain the amount of the relative internal specific surface (i.e., surface per unit volume, relative to a reference state) of a specimen, and are therefore beneficial in the investigation of defects such as cracks and pores within ceramic components.…”
Section: Methodsmentioning
confidence: 99%
“…X‐ray refraction techniques were introduced a couple of decades ago and have been successfully used for both materials characterization and non‐destructive testing . Those techniques are used to obtain the amount of the relative internal specific surface (ie, surface per unit volume, relative to a reference state) of a specimen, and therefore effective in the investigation of defects within ceramic components such as cracks and pores.…”
Section: Introductionmentioning
confidence: 99%
“…X-ray refraction techniques [20][21][22] are radiographic and tomographic techniques that combine a large field of view (several millimeters) with an exceptional detectability of small defects (whose size was estimated to lie below 1 nm). 23 While their spatial resolution is limited by the beam size in the laboratory (typically 50 by 1,000 μm), and by the camera pixel size at a synchrotron (typically 1-5 μm), they are able to detect nanometric objects.…”
Section: Introductionmentioning
confidence: 99%