2005
DOI: 10.1016/j.msec.2005.07.016
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Micro-electromechanical systems based on 3C-SiC/Si heterostructures

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Cited by 19 publications
(11 citation statements)
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“…For contacting of the nanowires, basically electron beam lithography or direct writing by focused ion beams (FIB) were employed. Finally, the releasing was realized either by dry 58–63 or by wet 64 chemical etching processes. Realized freestanding nanowires are shown in Figs.…”
Section: Methodsmentioning
confidence: 99%
“…For contacting of the nanowires, basically electron beam lithography or direct writing by focused ion beams (FIB) were employed. Finally, the releasing was realized either by dry 58–63 or by wet 64 chemical etching processes. Realized freestanding nanowires are shown in Figs.…”
Section: Methodsmentioning
confidence: 99%
“…Silane, ethene and hydrogen were used as precursors. Prior to the growth process, the Si wafers were cleaned by a standard RCA process, which was completed by a hydrogen termination of the surface 99.…”
Section: Fabrication Technologymentioning
confidence: 99%
“…The dominant approach is the growth of 3C-SiC layers on either oxidized or non-oxidized Si wafers as this clearly offers a route to larger wafer sizes that are currently available for bulk SiC. This typically produces the 3C polytype, usually in a polycrystalline form and can be achieved by a variety of CVD techniques [16][17][18][19][20][21]. PECVD has been widely studied as it requires relatively simple process conditions and can be used for large-area silicon substrates [22,23].…”
Section: Sic Mems Sensorsmentioning
confidence: 99%