“…In this study, a Tracer III‐SD handheld XRF spectrometer (Bruker AXS Handheld, Inc., Kennewick, USA) capable of rapid onsite analysis was used. This device is light and convenient to carry, and therefore, it has been widely used for analyzing historical cultural assets, archeological bricks, plants, and architectural stones . Our Tracer III‐SD was equipped with a Ag anode X‐ray tube, a silicon drift detector with energy resolution of 142 eV, and the original primary X‐ray filter consisting of 304.8‐μm (12‐mil) Al, 25.4‐μm (1‐mil) Ti, and 152.4‐μm (6‐mil) Cu (1 mil = 1/1,000 inch [25.4 μm]).…”