2011
DOI: 10.7166/22-2-24
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Micro-Material Handling Employing E-Beam Generated Topographies of Copper and Aluminium

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Cited by 3 publications
(6 citation statements)
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“…An atomic force microscope (AFM), model Asylum MFP 3 D-Bio with version 6.22A software, was used to measure the actual Van der Waals forces exerted by the e-beam deposited samples. The aim of the experiment was to obtain practical evidence to validate the Van der Waals forces modelled in Matope et al [9] concerning their applicability to micromaterials.…”
Section: Descriptions Of Experiments On E-beam Deposited Materialsmentioning
confidence: 99%
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“…An atomic force microscope (AFM), model Asylum MFP 3 D-Bio with version 6.22A software, was used to measure the actual Van der Waals forces exerted by the e-beam deposited samples. The aim of the experiment was to obtain practical evidence to validate the Van der Waals forces modelled in Matope et al [9] concerning their applicability to micromaterials.…”
Section: Descriptions Of Experiments On E-beam Deposited Materialsmentioning
confidence: 99%
“…The e-beam depositions generate a surface roughness of a specific root mean square (rms) value that greatly influences the Van der Waals forces exerted [7,12,3]. This paper, with experimental data, is a follow-up of an earlier publication in which the application of Van der Waals forces in micro-material handling operations was modelled [9]. In the modelling (which employed the formula of Rabinovich et al [11]), it was observed that for a reliable picking of a micro-part in a micro-material handling system, the picking place should exert less Van der Waals force than the microgripper; and the gripper, in turn, should exert less force than the placement position for an effective release.…”
Section: Introductionmentioning
confidence: 95%
“…The vapour in this case was deposited on a silicon substrate with a root mean square (rms) roughness of 0.43 nm. In this study, the vacuum pressures between 2x10-6 mbar and 3 x 10-6 mbar and deposition rates between 0.6 and 1.2 Angstroms/ second were used, same as in [11], [26] and [27]. The deposition time was either 5 or 20 minutes in each case.…”
Section: Micro-parts' Surface Preparationmentioning
confidence: 99%
“…The electron beam evaporation method (e-beam) was used to prepare the samples following the same procedure whose detail is found in other works [11,26,27]. E-beam method involves the use of an electron beam of high energy to convert the samples from solid state to vapour state under vacuum conditions.…”
Section: Micro-parts' Surface Preparationmentioning
confidence: 99%
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