2012
DOI: 10.1143/apex.5.027303
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Micro-/Nanofabrication of Cross-linked Poly(L-lactic acid) Using Electron Beam Nanoimprint Lithography

Abstract: Electron beam nanoimprint lithography was proposed for fabricating the micro-/nanostructures of cross-linked poly(L-lactic acid) (RX-PLLA). PLLA with triallyl isocyanurate (TAIC) solutions were dropped on the Si-molds fabricated by the conventional EB lithography technique. PLLA/TAIC on Si-molds were imprinted and cross-linked with doses from 10 to 500 kGy at room temperature under vacuum. The micro-/nanostructures of RX-PLLA were successfully obtained with high accuracy. Hence, it was found that the imprinted… Show more

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Cited by 4 publications
(3 citation statements)
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“…The evolutions of T g and T m shown in Figure 1E make it clear that PLLA and TAIC are thermodynamically miscible blends. According to our analysis of the SEM and DSC results, the miscibility between PLLA and TAIC is confirmed, which agrees with results previously reported in the literature [29][30][31][32]. This will be the basis for the following investigation of inclusion and exclusion behaviors of TAIC during the crystallization of PLLA.…”
Section: Resultssupporting
confidence: 91%
“…The evolutions of T g and T m shown in Figure 1E make it clear that PLLA and TAIC are thermodynamically miscible blends. According to our analysis of the SEM and DSC results, the miscibility between PLLA and TAIC is confirmed, which agrees with results previously reported in the literature [29][30][31][32]. This will be the basis for the following investigation of inclusion and exclusion behaviors of TAIC during the crystallization of PLLA.…”
Section: Resultssupporting
confidence: 91%
“…E-beam lithography (EBL) is a widely used patterning technique for nanofabrication in industry and academy, for its capability of high-resolution patterning and controllability without a mask [36][37][38]. However, there is the fact that a manufactured pattern differs from the one input to the EBL software.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, it does not need any requirements, as is the case of UV-NIL, for the mold materials [8,9].…”
Section: Introductionmentioning
confidence: 99%