The productions of the thin metallic chalcogenide films are of particular interest for the wide range of
fabrication of the solar cells, sensors, photodiode arrays, photoconductors. Raman spectroscopy is
used to measure the scattering radiation of a matter. Basically, the spectroscopic methods can be
defined as the study of the interaction of electromagnetic radiation with a matter. It can be based on
the phenomenon of absorption, fluorescence, emission or scattering. The observation of peaks supported
the formation of amorphous or crystalline nature of the samples. In this short review, the authors had
gathered some informations about the Raman studies of recently synthesized metal chalcogenide
semiconductor thin films.