Archaeological Soil and Sediment Micromorphology 2017
DOI: 10.1002/9781118941065.ch41
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Micro XRF

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Cited by 19 publications
(9 citation statements)
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“…Further, the potential for inclusions and voids to affect measurements and geochemical data visualization is an obvious limitation, though if inclusions are large enough they can be equally helpful in understanding site formation processes. Echoing Mentzer (), we note that detailed descriptions of each transect including void space or inclusions before any experiment is necessary. In cases where even higher resolution is needed, such Layer VII (Microfacies C) which was too thin to be adequately captured by our method, more high‐resolution methods such as µXRF (see Mentzer & Quade, ), macro‐XRF scanners, or core scanners could be applied.…”
Section: Resultsmentioning
confidence: 99%
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“…Further, the potential for inclusions and voids to affect measurements and geochemical data visualization is an obvious limitation, though if inclusions are large enough they can be equally helpful in understanding site formation processes. Echoing Mentzer (), we note that detailed descriptions of each transect including void space or inclusions before any experiment is necessary. In cases where even higher resolution is needed, such Layer VII (Microfacies C) which was too thin to be adequately captured by our method, more high‐resolution methods such as µXRF (see Mentzer & Quade, ), macro‐XRF scanners, or core scanners could be applied.…”
Section: Resultsmentioning
confidence: 99%
“…In our experience, applying pXRF to block samples can introduce its own issues which must also be considered by the analyst. These include, (a) ensuring proper degree of impregnation quality (e.g., length of time and setting during curation), which can be affected by the porosity of sediments and soils, especially in regard to clay‐rich samples which commonly demand the need to use a vacuum for proper impregnation (Courty et al, , p. 58), (b) measuring the chemical composition of the resin, which can include trace amounts of V, Cr, Co, Na, Ni, Ge, and Sb (Mentzer, ; Nakano & Nakamura, ), (c) understanding that there is an inability to determine the presence of inclusions or voids directly beneath the sampling area, and (d) controlling for the potential effect of differences between sampled areas that have large inclusions versus small (e.g., CaCO 3 nodules which would have strong Ca absorption which may affect the ability to interpolate nearby measurements). By following proper impregnation and curation protocols (see Goldberg & Macphail, , pp.…”
Section: Methodsmentioning
confidence: 99%
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“…It is known that for optical materials and their structures, one of the most important properties is the surface quality, since the roughness of the waveguides leads to scattering of light streams and, consequently, losses during the interaction of transmitted modes in the boundaries of the waveguides themselves. Thus, the increase in optical losses in devices as a result of scattering is proportional to the third degree of the difference in refractive indices between the core and the shell [6][7].…”
Section: Introductionmentioning
confidence: 99%