Microbeam analysis applied to adhesion, surfaces and interfaces

Watts, John F.

doi:10.1007/s00604-008-0070-x

Cited by 4 publications

(1 citation statement)

References 12 publications

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“…Early approaches in the literature employ mechanical methods such as ball cratering to expose the metal substrate but suffer from limitations that involve smearing of soft polymeric materials. A more successful approach, introduced by Watts at the University of Surrey, implies taper sectioning of samples by ultralow angle microtomy (ULAM) . ULAM makes use of a tungsten carbide microtome (an instrument frequently used in histology laboratories to cut extremely thin slices of materials) to expose the metal oxide–polymer interface. , Unfortunately, this method is limited to the use of thin (<100 μm) metal foils as the substrate material and is therefore not applicable to industrial samples.…”

Section: Introductionmentioning

confidence: 99%

Molecular Characterization of Bonding Interactions at the Buried Steel Oxide–Aminopropyl Triethoxysilane Interface Accessed by Ar Cluster Sputtering

et al. 2020

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The overall performance of any organic coating system on a metal is largely dependent on the primer coating which has the crucial function to ensure adhesion to the metal substrate. Although performance in terms of adhesion can be empirically measured, the underlying chemical adhesion mechanism is dicult to unravel. A detailed molecular characterization of interfacial chemistry is required for this purpose, but brings up the challenge to reach the buried interface without inducing excessive damage to its molecular structure. In this work, argon gas cluster ions are being applied to sputter through an aminosilane coating on steel, in order to access the steel oxide 1 silane interface with time-of-ight secondary ion mass spectrometry (ToF-SIMS). In-situ atomic force microscopy (AFM) measurements during the sputter process demonstrate the importance of optimizing the Ar gas cluster ion beam in order to minimize sputter induced roughness and molecular damage. ToF-SIMS spectra obtained at the buried steel oxide aminosilane interface accessed by sputtering were compared to spectra from a steel oxide aminosilane interface that was directly accessible without the need for sputtering. This comparison allowed to identify contributions from sputter induced damage in the buried interface spectra. Fragments characteristic for interfacial bonding interactions could be extracted, although there is a signicant loss of molecular information due to sputtering. Nevertheless, insights on the role of steel surface hydroxyl groups in the adsorption mechanism of aminosilanes could be obtained through deuteration of the steel substrate.

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Section: Introductionmentioning

confidence: 99%

Molecular Characterization of Bonding Interactions at the Buried Steel Oxide–Aminopropyl Triethoxysilane Interface Accessed by Ar Cluster Sputtering

et al. 2020

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Surface Analysis

Weng¹,

Chan²

2012

Wiley Encyclopedia of Composites

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Surface analysis has played an important role in the development of many advanced materials, including composites. This article describes the principles and instrumentation of the three most widely used surface analysis techniques: X‐ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Applications of these techniques in composites have been highlighted using some typical examples published recently. The strengths and weaknesses of each technique as well as the precautions of using these techniques in composites have also been critically reviewed.

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