“…1,2 In particular, the ability to micromachine silicon at the wafer scale has been an enabling technology for scanning probe-based techniques wherein nanoscale tips are fabricated on passive 3,4 and selfactuating [5][6][7][8] cantilevers. 1,2 In particular, the ability to micromachine silicon at the wafer scale has been an enabling technology for scanning probe-based techniques wherein nanoscale tips are fabricated on passive 3,4 and selfactuating [5][6][7][8] cantilevers.…”