Microcharacterization

Brodie, I.; Muray, Julius J.

doi:10.1007/978-1-4757-6775-9_6

Cited by 4 publications

(6 citation statements)

References 32 publications

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“…As the spatial resolution of human eyesight is about 200 μm (ref. 32 ) the smallest visible area ∼200 μm × 200 μm or 0.04 mm 2 . Thus, the spot area of 0.09 mm 2 obtained from a 1 nA current after 5 min is visible to the naked eye.…”

Section: Resultsmentioning

confidence: 99%

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Ultrasensitive visual read-out of nucleic acids using electrocatalytic fluid displacement

et al. 2015

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Diagnosis of disease outside of sophisticated laboratories urgently requires low-cost, user-friendly devices. Disposable, instrument-free testing devices are used for home and physician office testing, but are limited in applicability to a small class of highly abundant analytes. Direct, unambiguous visual read-out is an ideal way to deliver a result on a disposable device; however, existing strategies that deliver appropriate sensitivity produce only subtle colour changes. Here we report a new approach, which we term electrocatalytic fluid displacement, where a molecular binding event is transduced into an electrochemical current, which drives the electrodeposition of a metal catalyst. The catalyst promotes bubble formation that displaces a fluid to reveal a high contrast change. We couple the read-out system to a nanostructured microelectrode and demonstrate direct visual detection of 100 fM DNA in 10 min. This represents the lowest limit of detection of nucleic acids reported using high contrast visual read-out.

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Section: Resultsmentioning

confidence: 99%

“…This is too small to be easily visible to the naked eye as the spatial resolution of human eyesight is ∼100–200 μm (ref. 32 ).…”

Section: Resultsmentioning

confidence: 99%

Ultrasensitive visual read-out of nucleic acids using electrocatalytic fluid displacement

et al. 2015

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“…The expression for force obtained from the Green function is originally a linear combination of terms with different powers of ω ΛvF and, thus, the dominant term is the one with the smallest exponent, which explains the choice of α as the minimum of α 1 and α 2 in eq. (9).…”

Section: Non-chiral Bosonization Techniquementioning

confidence: 99%

“…The presence of an impurity can bring drastic changes to interacting systems, especially if the systems are one dimensional [7], whose physics is quite different from higherdimensional systems, better described by the Luttinger liquid model [8]. With the advancement in micro/nanofabrication [9], which has made the realization of 1D systems practical, there has been a growing interest towards problems concerned with the Tomonaga Luttinger (TL) liquids, the problem of an impurity in a TL liquid being one of them. The transport properties of TL liquids with localized impurities have been rigorously studied using bosonization, renornmalization group and other theoretical tools [7,10,11].…”

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confidence: 99%

Ponderous impurities in a Luttinger liquid

Das¹,

Setlur²

2018

EPL

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In this work, analytical expressions for the Green function of a Luttinger liquid are derived with one and two mobile impurities (heavy particles) using a combination of bosonization and perturbative approaches. The calculations are done in the random phase approximation (RPA) limit using the powerful non-chiral bosonization technique (NCBT) which is nothing but the resummation of the most singular parts of the RPA terms of the Green function expanded out in powers of the forward scattering between fermions with the source of inhomogeneities treated exactly. The force acting on the heavy particle(s) is studied as a function of its terminal velocity, both in the linear and non-linear regime. Linear mobility (which is valid for impurities moving much slower than a certain cross-over speed) has a power-law temperature dependence whose exponent has a closed algebraic expression in terms of the various parameters in the problem. This expression interpolates between the ballistic regime of no-coupling with the fermions and the no-tunneling regime. When the speed of the impurity is much larger than this cross-over speed, the applied force depends non linearly on the speed and this too is a power-law with a closely related exponent. The case of two mobile impurities is also studied whose mobility exhibits peculiar resonances when their mutual separation is appropriately chosen.

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“…As already pointed out, evolvement of manufacturing technologies for nanoelectronics and MEMS devices for advanced computing and sensing applications represents significant challenges [19,20]. Modeling and simulation of the fabrication processes, extensively used by the microelectronics industry, offer significant advantages in meeting these challenges [21][22][23][24][25].…”

Section: Introductionmentioning

confidence: 99%

Top down nano technologies in surface modification of materials

Radjenović

Radmilović-Radjenović

2011

Open Physics

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Abstract:This article contains a broad overview of etch process as one of the most important top-down technologies widely used in semiconductor manufacturing and surface modification of nanostructures. In plasma etching process, the complexity comes from the introduction of new materials and from the constant reduction in dimensions of the structures in microelectronics. The emphasis was made on two types of etching processes: dry etching and wet etching illustrated by three dimensional (3D) simulation results for the etching profile evolution based on the level set method. The etching of low-k dielectrics has been demonstrated via modelling the porous materials. Finally, simulation results for the roughness formation during isotropic etching of nanocomposite materials as well as smoothing of the homogeneous materials have also been shown and analyzed. Simulation results, presented here, indicate that with shrinking microelectronic devices, plasma and wet etching interpretative and predictive modeling and simulation have become increasingly more attractive as a tool for design, control and optimization of plasma reactors. PACS (2008):81.05. Rm, 85.40.Hp, 85.85.+j, 87.10.Ed

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Microcharacterization

Cited by 4 publications

References 32 publications

Ultrasensitive visual read-out of nucleic acids using electrocatalytic fluid displacement

Ultrasensitive visual read-out of nucleic acids using electrocatalytic fluid displacement

Ponderous impurities in a Luttinger liquid

Top down nano technologies in surface modification of materials

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