2022
DOI: 10.1109/taes.2022.3181117
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MicroCrack-Net: A Deep Neural Network With Outline Profile-Guided Feature Augmentation and Attention-Based Multiscale Fusion for MicroCrack Detection of Tantalum Capacitors

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Cited by 12 publications
(1 citation statement)
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“…Although different deep learning models were utilized to detect defects in different sectors [74,75], a few challenges persist due to the dependency of the performance on datasets [76]. Despite utilizing a small dataset, our findings showed an adequate performance when using one-stage models (YOLOv4-tiny, YOLOv5, and YOLOv8).…”
Section: Deep Learning Modelsmentioning
confidence: 72%
“…Although different deep learning models were utilized to detect defects in different sectors [74,75], a few challenges persist due to the dependency of the performance on datasets [76]. Despite utilizing a small dataset, our findings showed an adequate performance when using one-stage models (YOLOv4-tiny, YOLOv5, and YOLOv8).…”
Section: Deep Learning Modelsmentioning
confidence: 72%