2011
DOI: 10.1088/0022-3727/45/1/015101
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Microcrystalline thin-film solar cell deposition on moving substrates using a linear VHF-PECVD reactor and a cross-flow geometry

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Cited by 13 publications
(6 citation statements)
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“…This efficiency is only slightly lower than that for a solar cell incorporating an optimized i-layer grown statically (constant growth conditions) at the same deposition rate. This observation indicates that changes in the local growth conditions can be tolerated to a certain degree in a dynamic deposition process which is in agreement with earlier findings [13]. For μc-Si solar cells incorporating ilayers grown statically by VHF-PECVD using linear plasma sources efficiencies of 7.7 % at a deposition rate of 1.4 nm/s have been obtained showing that further improvements for dynamic deposition processes are possible.…”
Section: Resultssupporting
confidence: 91%
“…This efficiency is only slightly lower than that for a solar cell incorporating an optimized i-layer grown statically (constant growth conditions) at the same deposition rate. This observation indicates that changes in the local growth conditions can be tolerated to a certain degree in a dynamic deposition process which is in agreement with earlier findings [13]. For μc-Si solar cells incorporating ilayers grown statically by VHF-PECVD using linear plasma sources efficiencies of 7.7 % at a deposition rate of 1.4 nm/s have been obtained showing that further improvements for dynamic deposition processes are possible.…”
Section: Resultssupporting
confidence: 91%
“…Details of this process can be found elsewhere. 26,27 Sputtered ZnO:Al and silver were used as back contact. I-V measurements were performed in a class A sun simulator under AM1.5.…”
Section: Methodsmentioning
confidence: 99%
“…Since the µc-Si:H film formation was stopped before the X c growth increases, the continuous deposition time of µc-Si:H was shortened, and much of the amorphous phase easily formed [8]. Therefore, much of the amorphous phase increased V oc [3], and decreased I sc [33]. Since the shunt resistance was increased by the rising number of SEG, FF was decreased [34].…”
Section: Discussionmentioning
confidence: 99%