2007
DOI: 10.1002/sia.2585
|View full text |Cite
|
Sign up to set email alerts
|

Microfabrication and imaging XPS analysis of ITO thin films

Abstract: In this paper the microfabrication of ITO (tin-doped indium oxide) films by the sol-gel process combined with chemical modification is presented. The microfabricated ITO thin film could be obtained through a one-step process that combines film patterning with film leaching. The morphology and chemical components of the patterned ITO thin films were assessed by microscopy and XPS, respectively. Imaging XPS analysis is an effective way to evaluate the quality of the fine patterning.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

1
2
0

Year Published

2011
2011
2024
2024

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 11 publications
(3 citation statements)
references
References 14 publications
1
2
0
Order By: Relevance
“…According to literature survey, ITO analysis are typically based on spectral deconvolution using two sub-peaks—often ascribed to be contribution from crystalline and amorphous ITO. The observed peak shift between crystalline and amorphous phases—1.0 eV for In and 0.9 eV for Sn peaks—was found to stay in agreement with literature survey [ 44 , 45 , 46 ].…”
Section: Resultssupporting
confidence: 91%
“…According to literature survey, ITO analysis are typically based on spectral deconvolution using two sub-peaks—often ascribed to be contribution from crystalline and amorphous ITO. The observed peak shift between crystalline and amorphous phases—1.0 eV for In and 0.9 eV for Sn peaks—was found to stay in agreement with literature survey [ 44 , 45 , 46 ].…”
Section: Resultssupporting
confidence: 91%
“…XPS characterizations were carried out, as shown in Fig. 4, showing that the binding energy peaks at about 451.9 eV and 444.3 eV belong to In 3d 3/2 and In 3d 5/2 of ITO 19 respectively, while the binding energy peaks at 37.5 eV and 35.3 eV belong to W4f 5/2 and W4f 7/2 20 of WO 3 , respectively. Therefore, we can conclude that the composite films feature the ITO nanocrystals embedded in the amorphous WO 3 matrix.…”
Section: Resultsmentioning
confidence: 99%
“…[ 28 ] Moreover, X‐ray photoelectron spectroscopy (XPS) of the ITO@LGLZO pellet displayed only the characteristic peaks of ITO, as evidenced by In 3d (444.35 eV) and Sn 3d (486.36 eV) spectra (Figure S3, Supporting Information). [ 29 ] In addition, the characteristics associated with LGLZO are not observed, illustrating that the pellet has been completely covered with an ITO layer. It is observed from the cross‐sectional SEM image and energy dispersive X‐ray spectrometry (EDS) results of ITO@LGLZO (Figure 2d; Figure S4, Supporting Information), an ITO layer with a thickness of ≈700 nm was tightly adhered to LGLZO pellet and filled the voids near the surface.…”
Section: Resultsmentioning
confidence: 99%