2012
DOI: 10.7567/jjap.51.06ff05
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Microfabrication of Si-Based High-Index-Contrast-Grating Structure by Thermal Nanoimprint Lithography and Cl2/Xe-Inductively Coupled Plasma Etching

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Cited by 2 publications
(2 citation statements)
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“…The residual layer was removed by O 2 plasma using a reactive ion etching (RIE) system (Samco RIE-1). 26) As confirmed by SEM, a good transcriptional profile (square aperture patterns) of the quartz mold was obtained. Figure 3 TripC 12 film would become a useful Cl 2 -based dry etching mask for the nanoscale fabrication of semiconductors upon optimizing the nanoimprint lithography conditions.…”
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confidence: 59%
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“…The residual layer was removed by O 2 plasma using a reactive ion etching (RIE) system (Samco RIE-1). 26) As confirmed by SEM, a good transcriptional profile (square aperture patterns) of the quartz mold was obtained. Figure 3 TripC 12 film would become a useful Cl 2 -based dry etching mask for the nanoscale fabrication of semiconductors upon optimizing the nanoimprint lithography conditions.…”
mentioning
confidence: 59%
“…Instead, the resistivity of polymers against reactive plasma is very important for this process. 14) In general, polymers are structurally flexible and adopt complex random structures. In future nanolithography, accurate fine patterning of resist materials will be required.…”
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confidence: 99%