This work focuses on the crystal structure and magnetic properties of the hard magnetic Sm2Fe17N 𝛿 films prepared by dc magnetron sputtering and the subsequent nitriding process. The XRD, EDS, M-H and M-T data show that N enters the cell structure and the films with the single Th2Zn17 phase are obtained when the nitriding temperature varies from 300 to 400 ∘ C, thus the maximum value of the coercivity 𝐻𝐶 reaches 2561.7 Oe. However, the Sm2Fe17 phase decomposes to the SmN nonmagnetic phase and the 𝛼-Fe soft magnetic phase with further increasing nitriding temperature, which corresponds to the decreasing 𝐻𝐶 . Furthermore, the easy magnetization direction (EMD) is found to locate randomly in the film plane. This texture can not give an excellent 𝑀𝑅/𝑀𝑆 higher than the Stoner-Wohlfarth limitation (𝑀𝑅/𝑀𝑆 = 0.5), which agrees well with the observed low 𝑀𝑅/𝑀𝑆 (0.58). It is suggested that the magnetization reversal process is dominated by the nucleation mechanism according to the initial magnetization curve and the dependence of 𝐻𝐶 on the field 𝐻.