Microscopic Origins of Catastrophic Optical Damage in Diode Lasers

Hempel, Martin; Tomm, Jens W.; Mattina, Fabio La; Ratschinski, I.; Schade, Martin; Shorubalko, Ivan; Stiefel, Michael; Leipner, Hartmut S.; Kiessling, Frank M.; Elsaesser, Thomas

doi:10.1109/jstqe.2012.2236303

Cited by 31 publications

(22 citation statements)

References 21 publications

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“…At this point we conclude that the main degradation mechanism changes if devices are operated with high-power pulses instead of cw. This is a clear distinction to the situation with broad-area devices, where high-power pulsed operation was found to be something like a special type of accelerated aging [4,8]. Obviously, this is not the case here.…”

Section: Degradation Diagram and Internal Codmentioning

confidence: 74%

“…In regions, where the QW is annihilated by internal COD, this drain disappeared. This leads to the conclusion that an intact QW represents a much deeper potential well than the same material at the 'COD path' in the QW plane that is affected by amorphization [4].…”

Section: Analysis Of the Defect Pattern After Internal Codmentioning

confidence: 99%

“…Two types of defects are observed as a result of internal COD: First, there are the dark-line-networks of molten material, which are well known to accompany COD [3]. Second, the local temperature increase to 1600°C [4] creates point defects spreading laterally across a range of 100-300 µm. This scenario is similar to the one earlier observed in broad-area devices [5].…”

Section: Introductionmentioning

confidence: 99%

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Internal degradation of 980nm emitting single-spatial-mode lasers during ultrahigh power operation

et al. 2014

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Internal degradation of 980 nm emitting single-spatial-mode diode lasers during ultrahigh power operation is investigated for pulsed operation (2 µJ, 20 W). Analysis of the evolution of the emission nearfield with picosecond time resolution enables the observation of the transition from single-to multi-spatial-mode operation at elevated emission powers. Moreover, internal degradation events and subsequent defect propagation processes are in situ monitored by thermal imaging. Subsequently, these devices are opened and defect pattern are inspected by cathodo-and photoluminescence spectroscopy. The results complete earlier findings obtained with broad-area lasers and help to establish models covering defect generation and propagation in edge-emitting devices in general.

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Section: Degradation Diagram and Internal Codmentioning

confidence: 74%

Section: Analysis Of the Defect Pattern After Internal Codmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Internal degradation of 980nm emitting single-spatial-mode lasers during ultrahigh power operation

et al. 2014

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“…Together with the (subsequently analyzed) melting signatures and other independent temperature estimates [12], we conclude that at the locations along z, where MIR signatures are observed, the QW and vicinal waveguide material completely disappeared, i.e. replaced by amorphous material [13]. This explains also why at a given location, a MIR signal appears once only within one single pulse, and not in any of the following ones.…”

Section: Resultsmentioning

confidence: 55%

Short-wavelength infrared defect emission as probe for degradation effects in diode lasers

Hempel

Tomm

Yue

et al. 2015

Novel in-Plane Semiconductor Lasers XIV

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The infrared emission from 980-nm single-mode high power diode lasers is analyzed in the wavelength range from 0.8 to 7.0 µm. A pronounced short-wavelength infrared (SWIR) emission band with a maximum at 1.3 µm is found to originate from defect states located within the waveguide of the devices. The SWIR intensity is verified to represent a measure of the non-equilibrium carrier concentration in the waveguide, allowing for non-destructive waveguide mapping in spatially resolved detection schemes. The potential of this approach is demonstrated by measuring spatially resolved profiles of SWIR emission and correlating them with mid-wavelength infrared thermal emission along the cavity of devices undergoing repeated catastrophic optical damage. The enhancement of SWIR emission in the damaged parts of the cavity is due to a locally enhanced carrier density in the waveguide and allows for in situ analysis of the damage patterns. Moreover, spatial resolved SWIR measurements are a promising tool for device inspecting even in low-power operation regimes.

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“…Although HPDLs offer several advantages compared to other lasers, their output power is relatively low. The energy per pulse is limited to a few tens of µJ, due to the possibility of catastrophic degradation of end facets [18]. A possible solution to this problem is to efficiently combine the output optical power of several HPDLs via optical lenses and fibers [19].…”

Section: Introductionmentioning

confidence: 99%

Accurate Determination of Gold Nanorods Concentrations From Optoacoustic Signals Detected at 870 Nm and 905 Nm by Using High-Power Diode Lasers With Fast Switching Electronics

Leggio¹,

Gallego²,

Arroyo³

et al. 2017

PIER B

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Abstract-Optoacoustic imaging (OAI) is an emerging biomedical technique that allows visualization of in-depth tissues by using ultrasonic signals generated by short laser pulses. In this work, the authors combine the optical power of several pulsed high-power diode lasers (HPDLs) at 870 nm and 905 nm to a 7-to-1 675-µm fiber bundle to generate optoacoustic (OA) signals from different mixtures of two gold nanorods solutions with absorbance peak at ∼ 860 nm and ∼ 900 nm, respectively. The pulses produced to generate OA signals are alternated between the two wavelengths by a microcontroller circuit with fast switching (0.5 ms). From the amplitude of the OA signals, the concentrations of the nanoparticles solutions are easily estimated with high accuracy using a fluence model. The results achieved with the proposed system show very good agreement between the concentrations of gold nanorods estimated from measurements and the expected values.

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Microscopic Origins of Catastrophic Optical Damage in Diode Lasers

Cited by 31 publications

References 21 publications

Internal degradation of 980nm emitting single-spatial-mode lasers during ultrahigh power operation

Internal degradation of 980nm emitting single-spatial-mode lasers during ultrahigh power operation

Short-wavelength infrared defect emission as probe for degradation effects in diode lasers

Accurate Determination of Gold Nanorods Concentrations From Optoacoustic Signals Detected at 870 Nm and 905 Nm by Using High-Power Diode Lasers With Fast Switching Electronics

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