Microsphere-Assisted Interference Microscopy

Perrin, Stéphane; Lecler, Sylvain; Montgomery, P.C.

doi:10.1007/978-3-030-21722-8_17

Cited by 6 publications

(7 citation statements)

References 138 publications

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“…A transparent microsphere is usually placed in contact with or close to the object surface to be observed. [ 672 ] The axial position of the microsphere with respect to the object also influences the formation and the nature (real or virtual) of the image. [ 673 ] The combination with interferometry, using low coherence light, enables the surface topography reconstruction of sub‐wavelength objects with a high axial sensitivity ( Figure ).…”

Section: Microsphere‐assisted Interference Microscopymentioning

confidence: 99%

Roadmap on Label‐Free Super‐Resolution Imaging

Astratov,

Sahel,

Eldar

et al. 2023

Laser & Photonics Reviews

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Label‐free super‐resolution (LFSR) imaging relies on light‐scattering processes in nanoscale objects without a need for fluorescent (FL) staining required in super‐resolved FL microscopy. The objectives of this Roadmap are to present a comprehensive vision of the developments, the state‐of‐the‐art in this field, and to discuss the resolution boundaries and hurdles that need to be overcome to break the classical diffraction limit of the label‐free imaging. The scope of this Roadmap spans from the advanced interference detection techniques, where the diffraction‐limited lateral resolution is combined with unsurpassed axial and temporal resolution, to techniques with true lateral super‐resolution capability that are based on understanding resolution as an information science problem, on using novel structured illumination, near‐field scanning, and nonlinear optics approaches, and on designing superlenses based on nanoplasmonics, metamaterials, transformation optics, and microsphere‐assisted approaches. To this end, this Roadmap brings under the same umbrella researchers from the physics and biomedical optics communities in which such studies have often been developing separately. The ultimate intent of this paper is to create a vision for the current and future developments of LFSR imaging based on its physical mechanisms and to create a great opening for the series of articles in this field.

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Section: Microsphere‐assisted Interference Microscopymentioning

confidence: 99%

Roadmap on Label‐Free Super‐Resolution Imaging

Astratov,

Sahel,

Eldar

et al. 2023

Laser & Photonics Reviews

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show abstract

“…This allows the optical properties of the system and reference mirror to be determined (S sys (σ)•√[R ref (σ)]) or the spectral transfer function (STF). By keeping the same parameters of illumination intensity and optical arrangement as in the calibration step, the reflectivity of the sample can then be measured at each pixel in the image using the following formula: (7) For example, the results shown in Figure 4 show the local measurement of the reflectivity of a gold layer, with the uncalibrated spectra of gold and Si being shown in (a), the transfer function STF in (b), and the measured reflectivity of gold compared with theoretical values in (c).…”

Section: Optical Propertiesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

“…Since interference microscopy uses an optical probe, at ICube (IPP photonics team), we have recognized for a long time that it is possible to extend the different possibilities in characterization with this technique, and the results of this work are summarized in this paper. Results are presented of measuring, for example, the 3D structure of changing surfaces in real time, visualizing and characterizing defects inside transparent layers, measuring the local optical properties of inhomogeneous materials using local spectroscopy, and observing and measuring details with higher lateral resolution using microspheres placed between the sample and the microscope objective. , …”

Section: Introductionmentioning

confidence: 99%

“…Results are presented of measuring, for example, the 3D structure of changing surfaces in real time, 3 visualizing and characterizing defects inside transparent layers, 4 measuring the local optical properties of inhomogeneous materials using local spectroscopy, 5 and observing and measuring details with higher lateral resolution using microspheres placed between the sample and the microscope objective. 6,7 Some more recent applications have involved some challenging characterization conditions for measuring specific material parameters, notably requiring the development of environmental chambers placed under the interference microscope. We present some initial results of three interference microscope systems that have been combined with environmental chambers.…”

Section: ■ Introductionmentioning

confidence: 99%

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Characterization of Functional Materials Using Coherence Scanning Interferometry and Environmental Chambers

et al. 2023

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Functional materials are challenging to characterize because of the presence of small structures and inhomogeneous materials. If interference microscopy was initially developed for use for the optical profilometry of homogeneous, static surfaces, it has since been considerably improved in its capacity to measure a greater variety of samples and parameters. This review presents our own contributions to extending the usefulness of interference microscopy. For example, 4D microscopy allows real-time topographic measurement of moving or changing surfaces. High-resolution tomography can be used to characterize transparent layers; local spectroscopy allows the measurement of local optical properties; and glass microspheres improve the lateral resolution of measurements. Environmental chambers have been particularly useful in three specific applications. The first one controls the pressure, temperature, and humidity for measuring the mechanical properties of ultrathin polymer films; the second controls automatically the deposition of microdroplets for measuring the drying properties of polymers; and the third one employs an immersion system for studying changes in colloidal layers immersed in water in the presence of pollutants. The results of each system and technique demonstrate that interference microscopy can be used for more fully characterizing the small structures and inhomogeneous materials typically found in functional materials.

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Characteristic parameters of photonic nanojets of single dielectric microspheres illuminated by focused broadband radiation

Mandal

Tiwari

Dantham

2022

Sci Rep

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Herein, we report the theoretical investigation on the photonic nanojets (PNJs) of single dielectric microspheres illuminated by focused broadband radiation (polychromatic light) from a Halogen lamp, supercontinuum source, light-emitting diode, and Hg arc lamp. The role of incident beam waist, refractive index of the surrounding medium, and radius of the microsphere on the characteristic parameters such as the electric field intensity enhancement, effective width, and length of the PNJ is studied. Interestingly, the characteristic parameters of the PNJs of solid microspheres obtained for the above-mentioned broadband radiation sources are found close to those observed for the focused monochromatic radiation of wavelengths which are near to the central wavelengths of the sources. Moreover, the characteristic parameters of PNJs of the core–shell microspheres of different thicknesses (t) illuminated by polychromatic radiation from most commonly used sources such as Halogen and Hg arc lamps are studied. For each t value, a suitable wavelength of monochromatic radiation has been found to generate the PNJ with characteristic parameters which are close to those obtained in the case of polychromatic radiation. We believe that the analytical theory and the theoretical simulations reported here would be useful for researchers who work in the fields such as PNJ assisted photoacoustic spectroscopy, white light nanoscopy, low-coherence phase-shifting interference microscopy, and Mirau interferometry.

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Microsphere-Assisted Interference Microscopy

Cited by 6 publications

References 138 publications

Roadmap on Label‐Free Super‐Resolution Imaging

Roadmap on Label‐Free Super‐Resolution Imaging

Characterization of Functional Materials Using Coherence Scanning Interferometry and Environmental Chambers

Characteristic parameters of photonic nanojets of single dielectric microspheres illuminated by focused broadband radiation

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