1996
DOI: 10.1016/0921-4534(96)00437-6
|View full text |Cite
|
Sign up to set email alerts
|

Microstructructural comparison of YBa2Cu3O7−x thin films laser deposited in O2 and O2/Ar ambient

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

3
11
0

Year Published

1997
1997
2007
2007

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 11 publications
(14 citation statements)
references
References 30 publications
3
11
0
Order By: Relevance
“…While the field and temperature dependence of the current density show the qualitative behavior often reported in literature for laser ablated, sputtered, and MO-CVD thin films, the film thickness dependence is consistent only with strong pinning by sparse large second phase inclusions (such as Y 2 O 3 ). A model description of such pinning in different limits of flux line density and film thickness is consistent with the experimentally found behavior, if one assumes the inclu-sions to have the typical size 15 × 15 × 10 nm 3 obtained from previous TEM studies, 22,25 , with a defect density n i ∼ 1 − 3 × 10 21 m −3 . Such a defect density suggests in turn that at high fields, only a fraction of the vortices are pinned; these suffice to hold the entire lattice at rest until the critical current density is reached.…”
Section: Discussionsupporting
confidence: 78%
See 2 more Smart Citations
“…While the field and temperature dependence of the current density show the qualitative behavior often reported in literature for laser ablated, sputtered, and MO-CVD thin films, the film thickness dependence is consistent only with strong pinning by sparse large second phase inclusions (such as Y 2 O 3 ). A model description of such pinning in different limits of flux line density and film thickness is consistent with the experimentally found behavior, if one assumes the inclu-sions to have the typical size 15 × 15 × 10 nm 3 obtained from previous TEM studies, 22,25 , with a defect density n i ∼ 1 − 3 × 10 21 m −3 . Such a defect density suggests in turn that at high fields, only a fraction of the vortices are pinned; these suffice to hold the entire lattice at rest until the critical current density is reached.…”
Section: Discussionsupporting
confidence: 78%
“…22,23 Other authors have reported the presence of Y 2 O 3 inclusions in laser-ablated films as well, with typical densities n i Ϸ10 22 m Ϫ3 for inclusions of diameter D i ϳ3 -5 nm and n i Ϸ10 21 m Ϫ3 for D i ϳ10-20 nm. 24,25 Pinning by such large defects turns out to be conveniently described using an extension of the theory of strong pinning of Ovchinnikov and Ivlev, 26 which we shall develop below ͑Sec. II͒.…”
Section: ͑5͒mentioning
confidence: 99%
See 1 more Smart Citation
“…This means that atomic size point defects such as oxygen vacancies are unlikely the dominant pinning centers, and r p should be comparable to the dimension of other defects, such as precipitates and secondary-phase inclusions which are on the order of few to tens of nanometers in dimension. [10][11][12] Assuming that pinning in YBCO films is dominated by these large point defects, L c would be up to tens of nanometers, still an order of magnitude smaller than the relevant film thickness at which J c -t is important. It should be mentioned that the measured irreversible field H irr of YBCO thin films 13 has suggested an L c on the order of submicrometer.…”
mentioning
confidence: 99%
“…Many publications proved the existence of island nuclei even for monolayer c-axis YBCO films, and the islands grew larger with the film thickness. 20,21 The chemical compositions of precipitates have been reported as Y-rich or Cu-rich phases, 6,7,10,22 while a similar composition as the YBCO film matrix has been frequently observed for island-shaped precipitates. Growth modes reported for c-axis YBCO films were the island growth mode, [13][14][15] spiral growth mode, [16][17][18] or layer-by-layer growth mode 19 above a certain film thickness, while the layer-by-layer growth mode did not occur for the initial growth stage of YBCO.…”
Section: Introductionmentioning
confidence: 93%