2022
DOI: 10.1016/j.rinma.2022.100319
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Microstructural and creep characterization of Sn-0.7Cu and Sn-0.7Cu-xBi lead-free solders for low cost electronic

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Cited by 7 publications
(2 citation statements)
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“…Secondly, all samples were polished using grades of silicon paper and then washed in a solution of (CH3COOH3), after that, the samples were drawn using the rolling mechanism technique; the first group was as wires of a diameter (D=1mm) and a length (L=70Cm) for Creep properties, Finally, the samples were washed again in a solution of (CH3COOH3) in order to remove residual stress and defects induced during specimen formation [12,13,14].…”
Section: Methodsmentioning
confidence: 99%
“…Secondly, all samples were polished using grades of silicon paper and then washed in a solution of (CH3COOH3), after that, the samples were drawn using the rolling mechanism technique; the first group was as wires of a diameter (D=1mm) and a length (L=70Cm) for Creep properties, Finally, the samples were washed again in a solution of (CH3COOH3) in order to remove residual stress and defects induced during specimen formation [12,13,14].…”
Section: Methodsmentioning
confidence: 99%
“…Previous studies have contributed significantly by proposing new Sn-based alloys as potential alternatives to Sn-Pb alloys [10][11][12][13]. Particularly, the Sn-Ag, Sn-Ag-Cu, and Sn-Cu [wt.%] alloys seem to be the most promising choices for mechanical strength and electrical properties [14][15][16]. In recent years, the addition of Mg has emerged as a promising strategy to enhance the performance of these alloys.…”
Section: Introductionmentioning
confidence: 99%