Microstructural Characterization of Large Area C&amp;lt;sub&amp;gt;60&amp;lt;/sub&amp;gt; Films Obtained by Conventional Microwave Oven Irradiation

Martínez-Reyes, Jacobo; Barriga-Arceo, L. G. Díaz; Rendón-Vázquez, Luis; Martínez-Guerrero, R.; Romero-Partida, Néstor; Palacios, Eduardo; Garibay-Febles, V.; Ortíz-López, J.

doi:10.4236/wjnse.2012.24029

Cited by 3 publications

(3 citation statements)

References 50 publications

(36 reference statements)

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“…For C 60 the well-defined peak (220) in these patterns corresponds to the highly ordered crystalline structures and the peak (111) disappears in second ratio. The disappearing of some peak corresponding to Alq 3 and C 60 in thin films of the ratio (100:10) may be due to the increasing in amorphosity in these films caused by adding more quantity from C 60 , or may be due to the amorphous nature with some crystalline peak in the XRD patterns for both Alq 3 and C 60 thin films corresponds to a large distribution of possible molecular packing's when the powder has been diluted in solvent and spincoated onto glass substrates [16][17][18]. Noori et al…”

Section: Resultsmentioning

confidence: 99%

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Noori

Abbas

Abdulameer

2018

ijs

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In this work, has been a studied the effect of thermal treatment using different annealing temperatures (373, 423 and 473) K in vacuum on structural and morphological properties of organic semiconductor Alq 3 :C 60 thin films which are prepared by the spin coating on a glass, silicon and porous silicon. These films have been coated on substrates with speed of 2000 rpm. The structure properties of Tris(8-hydroxyquinoline) aluminum (III) (Alq 3) and fullerene (C 60) (100:1) and (100:10) blend as-deposited and treated have been studied by X-ray diffraction (XRD) for glass only and morphological properties by Atomic Force Microscope (AFM) for silicon and porous silicon substrates. The results of XRD pattern shows that the structure of (Alq 3 :C 60) as-deposited and annealed thin films are polycrystalline in nature for both mixed weight ratio. The result of AFM measurements show that grain size increase is due to the increases of surface energy at high temperature. Surface roughness increasing and decreased randomly with the temperature can be attributed to the random distributions of the grains and also due to the phase change.

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Section: Resultsmentioning

confidence: 99%

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Noori

Abbas

Abdulameer

2018

ijs

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“…The C60 molecules used in the present work were produced by the microwave synthesis method described in Mattínez-Reyes [51]. The fabrication was carried out in a conventional SAMSUNG microwave oven with a frequency of 2450 MHz, a wavelength of 12 cm and a maximum power of 1480 W. Prior to the synthesis, the temperature profiles of the oven were evaluated, for which the turntable was removed from the microwave to establish its maximum temperature points.…”

Section: Production Of Fullerene C60 Thin Filmsmentioning

confidence: 99%

Performance Assessment of Low-Temperature Solar Collector with Fullerenes C60 Manufactured at Low Cost in an Emerging Country

et al. 2022

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In this work, the performance of a low-temperature solar collector (LTSC) is evaluated, using carbon nanoparticles in water as working fluid. The nanoparticles used are crystallized fullerenes, with a red parameter of 1.42 nm ± 0.5 nm, with different volume fractions in water. The thickness of the carbon film was approximately 140 to 520 nm. The study is divided into three parts: modeling and simulation of an LTSC, low-cost production and characterization of nanoparticles, and thermal evaluation of the LTSC. For the study, fullerenes were produced by microwave synthesis from a terpenoid resin (Camphor) and the nanoparticles were characterized by scanning electron microscopy (SEM) and High-Resolution Transmission (HRTEM). Tests were carried out with different volumetric flow rates, 0.0111 LT/s, 0.0166 LT/s and 0.0194 L/s, and two volumetric concentrations, 0.035% and 0.063%. The results obtained from the fullerene nanofluid showed an improvement in the thermophysical properties compared to the properties of water. The performance results showed that the efficiency increases up to 47.2% compared to that of water, with a volume fraction of 0.063%, and a flow rate of 0.0194 LT/s.

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“…Para as amostras tratadas sem alumina, foram observados os mesmos picos apresentados nas amostras tratadas com alumina, no entanto, apresentaram menor intensidade para os picos de ferrita (α-Fe). Também foi possível observar o surgimento de um pico de grafite hexagonal (G-2H) em aproximadamente 2θ igual a 50,76° (carta JCPDS 89-7213) resultado semelhante foi encontrado por REYES et al [17] e também em PANG et al [18] no qual identificaram o pico de grafite-2H com plano (102) em 50,36°. Estas características podem contribuir na morfologia do filme, implicando em um filme menos regular e com maior rugosidade.…”

Section: Análise Por Difração De Raios X (Drx)unclassified

Deposição de filmes carbonosos em aço AISI D6 através da técnica de gaiola catódica

Senna¹,

Shica

Conceição

et al. 2020

Matéria (Rio J.)

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RESUMO Neste trabalho, filmes finos de carbono tipo diamante DLC (Diamond-like carbon) foram depositados em substratos de aço ferramenta AISI D6 por meio da técnica de deposição a plasma com gaiola catódica de grafite, com o objetivo de avaliar a influência dos parâmetros de tratamento, tais como a duração do tratamento e a polarização das amostras. As amostras tratadas foram avaliadas em termos de morfologia e estrutura por Difração de Raios X (DRX), Espectroscopia Raman e Microscopia Eletrônica de Varredura (MEV). Os resultados dos difratogramas indicaram a presença das estruturas de ferrita, grafite e diamante para as amostras tratadas com alumina e a formação de grafite com estrutura hexagonal para amostras tratadas sem alumina. Os espectros Raman identificaram a banda D e G característicos de materiais grafíticos e os melhores resultados foram obtidos para as amostras que não utilizaram alumina. As micrografias dos filmes utilizando alumina indicaram estruturas na forma de minúsculas partículas, com contornos mais claros e definidos. Já para as amostras sem alumina, os filmes DLC apresentaram um aspecto mais uniforme e de coalescência dos grãos. As camadas das amostras tratadas com alumina apresentaram as maiores espessuras de camadas, principalmente para a amostra tratada durante 6 horas. Em relação aos tratamentos sem alumina, as amostras tratadas por 5 e 6 horas apresentaram em média a maior espessura de camada. Assim, foi possível afirmar que a alumina e, também, o tempo de tratamento influenciam de forma significativa nas características de microestrutura e espessura final do filme.

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Microstructural Characterization of Large Area C<sub>60</sub> Films Obtained by Conventional Microwave Oven Irradiation

Cited by 3 publications

References 50 publications

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Annealing effect on the structural and Morphological properties of Organic Semiconductor Alq3:C60 blend Thin Films

Performance Assessment of Low-Temperature Solar Collector with Fullerenes C60 Manufactured at Low Cost in an Emerging Country

Deposição de filmes carbonosos em aço AISI D6 através da técnica de gaiola catódica

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