Microstructural characterization of reaction products in Cu/Graphene/SiC system

Abstract

The results of microstructural examinations of reaction products formed at liquid copper/graphene-coated monocrystalline SiC interface are presented. Samples were prepared during a wettability test performed under a vacuum at T = 1100 °C kept constant for 30 min by capillary purification-sessile drop method. Careful analyses of the microstructure and chemical composition were carried out at the interfaces by high resolution scanning electron microscopy combined with local analysis of chemical composition, Raman spectroscopy and computed tomography. The detailed structural investigations showed that in both systems, at the drop/substrate interface, the substrate (SiC) was dissolved and the zone of reaction products was composed of alternately arranged dark and bright layers.