“…Site-specific samples for atom probe tomography (APT) were prepared using dual-beam focused-ion beam (FIB) microscope (FEI Helios Nanolab, Hillsboro, OR, USA) by following a standard lift-out procedure, the details of which are described elsewhere. [9] APT experiments were done at a specimen base temperature of 60 K in ultrahigh vacuum (<10 À8 Pa), and the data obtained were analyzed using the program IVAS 3.6 (Cameca, Madison, WI). The mean radius, hRi, number density (N v ), and volume fraction (F) of Cu precipitates were determined using the envelope method, which is based on the maximum separation distance algorithm.…”