2005
DOI: 10.1016/j.jeurceramsoc.2005.03.146
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Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy

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Cited by 21 publications
(13 citation statements)
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“…Then it is reasonable to assume that the ability of a material to resist high-voltage conditions without reaching breakdown is directly linked to its charge trapping and scattering properties. 2,3 Of course, these properties depend on the material microstructure 4,5 and in particular on the interfaces. Indeed, grain boundaries, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…Then it is reasonable to assume that the ability of a material to resist high-voltage conditions without reaching breakdown is directly linked to its charge trapping and scattering properties. 2,3 Of course, these properties depend on the material microstructure 4,5 and in particular on the interfaces. Indeed, grain boundaries, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…It is worth noting that, at room temperature and in the same impure polycrystalline samples, breakdown strength increases with the grain sizes (Liebault, 1999;Si Ahmed et al, 2005), which is also the case for the fraction of removed charges R. Therefore this correlation confirms the importance of charge spreading to prevent breakdown.…”
Section: Charge Spreading In Impure Sintered Aluminamentioning
confidence: 58%
“…In this section, complementary investigations concerning the use of Positron Annihilation Lifetime Spectroscopy "PALS" for the characterization of defects in alumina will be summarized Si Ahmed et al, 2005). After a short description of the procedure, we will spotlight the results relevant to the charging properties.…”
Section: Characterization Of Defects In Sintered Alumina Using Positrmentioning
confidence: 99%
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“…Defects of the microstructure such as pores, grain boundaries, impurities, crystallographic defects and secondary phases are considered as trapping sites. Therefore, it is generally believed that the resistance against dielectric breakdown is directly connected to microstructure properties 7,8,9,10 . In the present study, the focus is on the dielectric breakdown behaviour of alumina single crystals.…”
Section: Introductionmentioning
confidence: 99%